MCF@DPMS

DST - FIST and TIET

SPONSORED

Materials Characterization Facility

Department of Physics & Materials Science

Thapar Institute of Engineering and Technology

Patiala - 147004, INDIA

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EQUIPMENT STATUS

X-ray Diffraction: Working
FEG-SEM: Not working
Raman Spectrometer: Working
Multiferroic Test System: Working
Vibrating Sample Magnetometer: Working
Scanning Probe Microscope: Not working
ICP-OES Analyzer: Working

CHECK THE FOLLOWING SHEET FOR INTERNAL USER SAMPLE STATUS

XRD fetched data

CHECK THE FOLLOWING SHEET FOR EXTERNAL USER SAMPLE STATUS

XRD External fetched data

X-Ray Diffractometer (XRD)

Scanning Electron Microscope (SEM)

Raman and PL Spectrometer (RAMAN)

Multiferroic Test System

Vibrating Sample Magnetometer (VSM)

ICP- OES Analysis

Scanning Probe Microscope (SPM)

Prof. Bhupendrakumar Chudasama

Coordinator

Materials Characterization Facility

G-Block

Department of Physics & Materials Science

Thapar Institute of Engineering and Technology

Patiala, 147004, INDIA

Email: mcf_spms@thapar.edu

(M) +91-9781966136

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