X-ray Photoelectron Spectrometer with Ultraviolet Photoelectron Spectrometer
X-ray Photoelectron Spectrometer with Ultraviolet Photoelectron Spectrometer
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Make: Thermo Scientific USA
Make: Thermo Scientific USA
Model: Nexsa G2
Model: Nexsa G2
Specifications:
X-ray Source: Monochromatic Al Kα (1486.6 eV), micro-focused beam with adjustable spot size (10–400 µm)
Analyzer: 180° double-focusing hemispherical electron energy analyzer with multichannel detector
Sensitivity & Resolution: High sensitivity (~0.1 atomic %) with rapid data acquisition
Ion Sources (Depth Profiling): Monatomic Ar⁺ ion gun
Charge Neutralization: Dual-beam flood gun (electrons + ions) for analysis of insulating samples
Sample size: Up to 60 × 60 mm size, 20 mm thickness; automated load-lock transfer
Imaging & Mapping: SnapMap capability for elemental and chemical state imaging
Advanced Modes: Angle-resolved XPS (ARXPS), depth profiling and UPS (Ultraviolet photon spectroscopy)
Sample requirement: Bulk (Single crystal/polycrystal /amorphous solid) / thin films / pelletized powder
Important note: The system can not handle liquids or moisture-containing samples/powders.
More details of this instrument is available at Thermo Fisher Scientific Website.
SAMPLE DEPOSITION
SAMPLE DEPOSITION
Users can download the requisition slip here.
We will not send an e-mail corresponding to the slot for XPS measurements. Please submit your samples after the slot booking.
Users need to collect samples after the scan if required. Samples will be disposed off after 6 months.
If the user does not wish to be present during the measurement, samples can be submitted to the office of the Head, Department of Physics and Materials Science (G-223) at least one day before the scheduled appointment.
Timings for sample deposition: 3 PM – 5 PM (Monday to Friday).
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