Specifications:
Electron Source & Optics
Electron gun: X-CFEG (Cold FEG)
Accelerating voltage: 80 kV / 200 kV
Objective lens: Constant-power X-TWIN lens system
Resolution Performance
TEM (HRTEM) resolution: ≤ 0.10–0.12 nm
STEM (HAADF) resolution: ≤ 0.14 nm
Information limit: ~110 pm
Imaging & Detection Modes
TEM / HRTEM imaging
Electron nano diffraction capability
STEM imaging modes:
Bright Field (BF)
Dark Field (DF)
High-Angle Annular Dark Field (HAADF)
Differential Phase Contrast (DPC / iDPC)
Analytical Capabilities
EDS system: Super-X G2 (4 Silicon Drift Detectors, high solid angle)
EDS energy resolution: ~136 eV
Camera & Detectors
Camera: Ceta 16M CMOS (high-speed)
Frame rate: up to ~25 fps (512 × 512)
STEM detectors: HAADF, BF/DF, segmented (panther) detectors
More details of this instrument is available at Transmission Electron Microscope Thermo Fisher Scientific - IN
NOTICE
1. Samples must be electrically conducting.
2. Powder samples to be dispersed on carbon coated TEM grid
2. Samples with moisture or degassing problems will not be accepted.
3. Samples must be submitted at least one day in advance for preparation. If not, the booking will be automatically cancelled.