X-ray Diffractometer
X-ray Diffractometer
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Make: Smartlab Rigaku, Japan
Make: Smartlab Rigaku, Japan
Model: SmartLab SE
Model: SmartLab SE
Cu-anode
BB and PB configurations for powder and thin films
HyPix-400 (2D HPAD) detector
2D diffraction pattern
GIXRD measurement (Only for thin films)
Reflectivity measurement (Only for thin films)
Stress analysis and
Texture analysis
More details of this instrument is available at SmartLab SE | Rigaku Global Website.
SAMPLE DEPOSITION
SAMPLE DEPOSITION
Users can download the requisition slip here.
We will not send an e-mail corresponding to the slot for XRD measurements. Please submit your samples after the slot booking.
Users need to collect samples after the scan if required. Samples will be disposed off after 6 months.
If the user does not wish to be present during the measurement, samples can be submitted to the office of the Head, Department of Physics and Materials Science (G-223) at least one day before the scheduled appointment.
Timings for sample deposition: 3 PM – 5 PM (Monday to Friday).
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