Post date: Jun 11, 2017 10:30:45 AM
This call for papers (below) is not perfectly relevant to us, but perhaps we could still make a contribution to the special issue arguing that software testing and program analysis have to be considerably enlarged as concepts to account for this new thrust and future social requirements.
IEEE Transactions on Reliability
Special Section on Software Testing and Program Analysis
Call for Submissions
Special Section on Software Testing and Program Analysis, Software Testing, Program Analysis, SWTP, IEEE Transaction on Reliability
Submission site: https://mc.manuscriptcentral.com/tr-ieee
Deadline: August 1, 2017
IEEE Transactions on Reliability has a special section soliciting
original work in software testing and program analysis that provides
novel theoretical contribution or comprehensive empirical validation
to show the application of existing techniques to industry applications.
Papers will be reviewed and selected based on their innovation,
technical correctness, presentation, and practical relevance.
TOPICS
The topics of interest include, but are not limited to, the following:
- Theoretical foundations of software testing and static/dynamic
program analysis
- Model- and specification-based testing and analysis
- Effectiveness and efficiency of test case generation
- Regression testing and test case prioritization
- Test adequacy and coverage-based testing
- Test oracles and runtime verification
- Mutation testing and analysis
- Functional and nonfunctional testing
- Fault localization and program repair
- Cloud and web-based testing and analysis
- Testing and analysis for security, safety, big data, and
IoT applications
- Testing and analysis tools and applications
- Software measurement and prediction
- Code clone analysis and management
- Case studies, benchmark work, and industrial practice
SUBMISSION
We welcome high quality submissions that are original work, not
published, and not currently submitted elsewhere. We also encourage
extensions to conference papers, unless prohibited by copyright, if
there is a significant difference in the technical content and does
not involve self-plagiarism. Each submission must conform to the
two-column publication format of IEEE Transactions on Reliability.
GUEST EDITORS
- Professor Yves Le Traon (Lead Guest Editor),
University of Luxembourg, Luxembourg
- Professor Zhenyu Chen, Nanjing University, China
- Professor T.H. Tse, The University of Hong Kong, Hong Kong
EDITOR-IN-CHIEF
W. Eric Wong, University of Texas at Dallas, USA
GENERAL INQUIRIES
Send emails to the Lead Guest Editor <Yves.LeTraon@uni.lu>