June 21, 2013: Beamline highlight: Enabling Thin Silicon Solar Cell Technology. Read the story here.
Welcome to the X-Ray Microdiffraction facility at the Advanced Light Source!
BL 12.3.2. is a superconducting magnet X-ray microdiffraction (or micro X-ray diffraction) beamline facility at the Advanced Light Source of the Lawrence Berkeley National Laboratory
Follow updates, comment and ask questions about BL12.3.2. and the XMAS software on Facebook.
January 22, 2014: Beamline highlight on Phys.org: mapping strain and crack propagation in metal tubing. Read the story here.
October 17, 2013: Beamline highlight: Concrete Industry benefits from Ancient Romans. Read the story here.
July 25, 2013: Beamline highlight: ALS Gives Chevron Scientists New Insights into Corrosion Resistance. Read the story here.
July 24, 2013: The new phase mapping capability has now been implemented in XMAS... Test case on a three phases sample. Top left: resulting phase distribution map (red: quartz, green: pyrite, blue:chalcopyrite), top right: orientation map. Bottom: fluorescence maps of iron and copper for sanity check... (courtesy: Andrea Gerson)
November 28, 2012: CISCO Systems uses BL 12.3.2 for their research on tin whiskers, read the story here.
Beamline 12.3.2 overview
X-ray diffraction is a powerful experimental technique
that is routinely used to investigate the structural
properties of materials. We use
x-rays focused to a spot size of one micron or less to
perform x-ray diffraction experiments with very high
spatial resolution. X-ray microdiffraction is providing
new insights in the fields of material, energy and
environmental sciences. The ALS X-ray microdiffraction
facility has undergone a major upgrade in 2007 with
its move from the bending magnet end-station 7.3.3. to
the superbend beamline 12.3.2. The move was made possible through a NSF grant headed by the Iowa State University. The new end-station with
its enhanced capabilities including brighter beam,
smaller spot size, better strain sensitivity and broader
energy range is now operational.
Why use synchrotron x-ray microdiffraction?
- Materials properties such as strength and fatigue resistance are highly dependent on microstructure. X-ray microdiffraction can measure local variations in stress, orientation, and plastic deformation between grains and within individual grains, helping us understand mechanical properties at this critical length scale.
- In microelectronics and related industries, the dimensions of the constitutive devices range from a few microns to submicron. Confinement and interfaces make thin film mechanical properties drastically different than bulk materials. With x-ray microdiffraction, we can measure local characteristics such as texture and stress within individual devices, offering an experimental counterpart to computer simulations.
- Samples such as soils are highly complex and are a challenge for spatially resolved characterization. X-ray microdiffraction allows for structural identification of small amounts of phases embedded in a heterogeneous matrix.
For questions and comments about this site, contact Nobumichi Tamura