Welcome to the X-Ray Microdiffraction facility at the Advanced Light Source!
BL 12.3.2. is a superconducting magnet X-ray microdiffraction (or micro X-ray diffraction) beamline facility at the Advanced Light Source of the Lawrence Berkeley National Laboratory
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August 10, 2016: ALS Science Brief: Improving Alloy Memory by Tuning Material Composition.
May 23, 2016: Characterization of highly reversible phase transformation is the Featured Article and front cover of this week issue of Applied Physics Letters.
February 4, 2016: New ALS Science Brief: Conduction Along Magnetic Interfaces Could Improve Memory Devices. Read the story here.
March 19, 2015: Beamline highlight in ALS Science brief: evolution of Roman Ceramics reflects change in technology. Read the story here.
December 18, 2014: new cooling stage capable of generating stable temperature gradient adds new capability to beamline for phase transformation studies.
June 21, 2013: Beamline highlight: Enabling Thin Silicon Solar Cell Technology. Read the story here.
December 17, 2014: Beamline highlight on ifls: roman concrete insight could help build a safer world. Read the story here.
January 22, 2014: Beamline highlight on Phys.org: mapping strain and crack propagation in metal tubing. Read the story here.
October 17, 2013: Beamline highlight: Concrete Industry benefits from Ancient Romans. Read the story here.
July 25, 2013: Beamline highlight: ALS Gives Chevron Scientists New Insights into Corrosion Resistance. Read the story here.
July 24, 2013: The new phase mapping capability has now been implemented in XMAS... Test case on a three phases sample. Top left: resulting phase distribution map (red: quartz, green: pyrite, blue:chalcopyrite), top right: orientation map. Bottom: fluorescence maps of iron and copper for sanity check... (courtesy: Andrea Gerson)
November 28, 2012: CISCO Systems uses BL 12.3.2 for their research on tin whiskers, read the story here.
Beamline 12.3.2 overview
X-ray diffraction is a powerful experimental technique
that is routinely used to investigate the structural
properties of materials. We use
x-rays focused to a spot size of one micron or less to
perform x-ray diffraction experiments with very high
spatial resolution. X-ray microdiffraction is providing
new insights in the fields of material, energy and
environmental sciences. The ALS X-ray microdiffraction
facility has undergone a major upgrade in 2007 with
its move from the bending magnet end-station 7.3.3. to
the superbend beamline 12.3.2. The move was made possible through a NSF grant headed by the Iowa State University. The new end-station with
its enhanced capabilities including brighter beam,
smaller spot size, better strain sensitivity and broader
energy range is now operational.
Why use synchrotron x-ray microdiffraction?
- Materials properties such as strength and fatigue resistance are highly dependent on microstructure. X-ray microdiffraction can measure local variations in stress, orientation, and plastic deformation between grains and within individual grains, helping us understand mechanical properties at this critical length scale.
- In microelectronics and related industries, the dimensions of the constitutive devices range from a few microns to submicron. Confinement and interfaces make thin film mechanical properties drastically different than bulk materials. With x-ray microdiffraction, we can measure local characteristics such as texture and stress within individual devices, offering an experimental counterpart to computer simulations.
- Samples such as soils are highly complex and are a challenge for spatially resolved characterization. X-ray microdiffraction allows for structural identification of small amounts of phases embedded in a heterogeneous matrix.
For questions and comments about this site, contact Nobumichi Tamura