Beamline 12.3.2 provides for the rapid collection of x-ray diffraction data with extremely high spatial resolution. The capabilities of the beamline include:
Beamline 12.3.2 characteristics:
- High x-ray flux provided by synchrotron superconducting magnet source.
- M1 toroidal mirror to refocus beam at the entrance of the experimental hutch.
- Elliptically bent ultrasmooth mirrors in a Kirkpatrick-Baez configuration provide micron to submicron x-ray spot size on the sample.
- Mirrors provide achromatic focusing, allowing the use of white x-ray beam (5-22 keV) for Laue diffraction.
- A 4-bounce Si(111) monochromator allows switching between white and monochromatic radiation while illuminating the same area of the sample.
- A high precision XY positioning stage allows scanning of the sample under the microbeam and collecting diffraction data at each step (Scanning x-ray microdiffraction).
- A MAR133 CCD detector provides collection of diffraction data from a large solid angle.
- A Vortex-EM detector for X-ray fluorescence mapping.
- Labview interface for motor controls.
- Custom in-house software suite (XMAS) allows for automated data collection and analysis.