XPS Capabilities
XPS Capabilities
Embedded Files
Superior Micro Area Performance
Superior Micro Area Performance
5 µm minimum x-ray beam size
Scanning x-ray image (SXI) for accurate point-and-click analysis area definition
Sample Versatility
Sample Versatility
No-tune dual beam charge neutralization for insulating materials
XPS Modes of Analysis
XPS Modes of Analysis
Chemical State
Chemical State
Identification
Identification
Sputter Depth
Sputter Depth
Profiling
Profiling
Elemental and Chemical
Elemental and Chemical
Mapping
Mapping
Common XPS Applications
Common XPS Applications
2D and 3D Nanomaterials
Adhesion and non-wetting
Analysis of discolored surfaces
Chemical bonding and oxidation state
Catalysis
Corrosion / Oxidation
Elemental composition
Embedded interface chemistry
Heterogeneous surface composition
Layer thickness
Molecular orientation
Orientation, concentration, thickness, coverage issues
Process monitoring
Reverse engineering
Self-assembled monolayer formation
Stoichiometry
Surface cleanliness
Surface modification
Surface segregation
Thin film diffusion
And more...
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