A new study co-authored by Professor Haejoong Kim of Kyonggi University, titled “A digital twin calibration for an automated material handling system in a semiconductor fab,” has been published in the prestigious Journal of Manufacturing Systems (Volume 80, 2025). 

The research presents a highly practical and industry-relevant digital twin calibration framework for Automated Material Handling Systems (AMHS) in semiconductor wafer fabs. As fabs continue to grow in scale and complexity, accurately replicating system behavior in a digital twin environment has become essential for evaluating congestion, ensuring reliable dispatching, and improving vehicle routing performance.

The study also utilizes Siemens Plant Simulation to construct high-fidelity wafer-fab logistics models, enabling precise evaluation of vehicle behavior under different dwelling strategies. This work further strengthens Professor Kim’s research portfolio, which has consistently demonstrated how Plant Simulation can be effectively applied to complex manufacturing and logistics challenges across both semiconductor and automotive industries. 

Bonggwon Kang, Chiwoo Park, Haejoong Kim*, Soondo Hong*, "A digital twin calibration for an automated material handling system in a semiconductor fab." Journal of Manufacturing Systems, 80, 2025, 1013-1028, https://doi.org/10.1016/j.jmsy.2025.04.015