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Facilities

USER FACILITY at Jackson State University

Asylum Atomic Force Microscope:

(i) Surface morphology, height and amplitude maping, Phase imaging of the sample

(ii) KPFM potential mapping

(iii) Piezo force microscopy (PFM) of ferroelectric materials

(iv) Magnetic Force Microscopy (MFM) of ferromagnetic magnetic samples

(v) Electrical measurements through contact mode

Laser Writer (Microtech LW405 series):

Maskless Lithography: It allows for direct exposure of photoresist on substrates (wafers, glass) without needing a prefabricated photomask.

Resolution: Typically offers a minimum linewidth of 0.6 µm

Wavelength: Operates with a 405 nm laser diode (UV)

Pattern Input: Formats such as GDSII, CIF, DXF

Substrate Handling: Accommodates various substrate sizes, often up to 6-inch wafers (150mm x 150mm working area).

Spin Coater:

Spin Coating from 500rpm to 10,000rpm of any photoresist

Thermal Evaporator:

Coming Soon

Electrical Measurement Setup:

We have variety types of experimental facilities at JSU to study transport and surface properties of nanostructure materials and devices.

Signatone Probe Station

For transport measurement and preparing heterostructure 2D layered devices.

(Right) Keithley Source meters 2600, 2635, 4200 are available for electrical measurements.

Pinki and Dr Pradhan during the work on probe station

Plasma Cleaner

Substrate cleaning to Fabricate high quality 2D Materials based devices

2D Materials Transfer Station from HQ Graphene, Netherland

Fully motorized 2D materials transfer systems from HQ Graphene.

Rohit and Saurabh during their work on the 2D Materials Transfer Station

Atomic Force Microscope Facilities

Several experimental studies on 2D materials are under investigation using AFM technique.

This AFM is coupled with the ferroelectric Tester to explore tiny sample using contact mode AFM technique.

Topography

Ferroelectric P-E Loop

Capacitance, Current vs E-field can be measured

Graduate Student Roshan Padhan working on Veeco Dimension AFM

Low temperature Cryostat to be ready

This allowed us to conduct transport measurement of the sample till 4K.

Broadband Dielectric and Ferroelectric Tester Setup:

Broadband Dielectric Measurement Setup (4 Hz to 8 MHz) to study the various polymer based nanocomposites.

Radiant Technology Precession II Ferroelectric Tester with High voltage (10kV) power source

(right) Capacitor charging and Discharging station.

William, Rohit and Pallavi on Dielectric Measurement of the sample

Furnace for Crystal Growth:

High Temperature Furnace and Hydrothermal Method for Crystal growth.

Several layered crystals can be grown using CVT technique.

Crystal Sealing Station

Fume Hood for use of chemicals and sample preparation.

A small portable vacuum glove box to store sample preventing from oxygen atmosphere .

Thermal Evaporator: COMING SOON

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