Journals

Mandovi Mukherjee, Burhan Mudassar, Minah Lee, Edward Lee, and Saibal Mukhopadhyay, ”Energy Efficient Pixel-Parallel Read-Out Circuits for Digital Image Sensors using Cross-Layer Pixel Depth Control,” in IEEE Sensors Journal, 2021.

Minah Lee, Burhan Mudassar, and Saibal Mukhopadhyay, ”Adaptive Camera Platform using Deep Learning based Early Warning of Task Failures,” in IEEE Sensors Journal, 2021.

Minah Lee, Mandovi Mukherjee, Edward Lee, Priyabrata Saha, Mohammad Faisal Amir, Taesik Na, and Saibal Mukhopadhyay, ”Cross-Layer Noise Analysis in Smart Digital Pixel Sensors With Integrated Deep Neural Network,” in IEEE Journal on Emerging and Selected Topics in Circuits and Systems (JETCAS), 2020.

Conferences

Minah Lee, Anni Lu, Mandovi Mukherjee, Shimeng Yu, and Saibal Mukhopadhyay, “CLUE: Cross-Layer Uncertainty Estimator for Reliable Neural Perception using Processing-in-Memory Accelerators,” in IEEE International Joint Conference on Neural Networks (IJCNN), June 2023.

Minah Lee, Burhan A. Mudassar, and Saibal Mukhopadhyay, “Lightweight Model Uncertainty Estimation for Deep Neural Object Detection,” in IEEE International Joint Conference on Neural Networks (IJCNN), July 2022. (Best Paper Award)

(Invited) Minah Lee, Xueyuan She, Biswadeep Chakraborty, Saurabh Dash, Burhan Mudassar, and Saibal Mukhopadhyay, “Reliable Edge Intelligence in Unreliable Environment,” in IEEE Design, Automation, and Test in Europe (DATE), February 2021.

Mandovi Mukherjee, Burhan A. Mudassar, Minah Lee, and Saibal Mukhopadhyay, ”Algorithm-Circuit Cross-layer Control for Digital Pixel Image Sensors,” in IEEE Sensors, October 2020. (Best Student Paper Award 3rd Place)

Minah Lee, Burhan A. Mudassar, Taesik Na, and Saibal Mukhopadhyay, “WarningNet: a deep learning platform for early warning of task failures under input perturbation for reliable autonomous platforms,” in ACM/IEEE Design Automation Conference (DAC), July 2020.

Minah Lee, Mandovi Mukherjee, Priyabrata Saha, Mohammad F. Amir, Taesik Na, and Saibal Mukhopadhyay, ”Effect of Process Variations in Digital Pixel Circuits on the Accuracy of DNN based SmartSensor,” in Artificial Intelligence Circuits and Systems (AICAS), March 2020.

Minah Lee, Burhan A. Mudassar, Taesik Na, and Saibal Mukhopadhyay, “A Spatiotemporal Pre-processing Network for Activity Recognition under Rain,” in British Machine Vision Conference (BMVC), September 2019.

Taesik Na, Minah Lee, Burhan A. Mudassar, Priyabrata Saha, Jong Hwan Ko, Saibal Mukhopadhyay, “Mixture of Pre-processing Experts Model for Noise Robust Deep Learning on Resource Constrained Platforms,” in IEEE International Joint Conference on Neural Network (IJCNN), July 2019.