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Metrosemi.com offers comprehensive set of metrology systems that allows chip manufacturers to maintain tight control of their processes for improved device performance and yield. We offers metrology and characterization systems for front-end, back-end, as well as research and development applications.
Single-Shot Metrology Tool
Single-Shot Metrology Tool
Single Machine for Stress, Thickness and Defect Measurement. Precise, Fast, and Non-contact Laser mechanism with non moving parts
The RENISHAW system unites the two high complementary techniques LIBS and RAMAN. By means of a high-quality sample image, pre-selected measurement positions are analysed either with Raman or LIBS or with both methods sequentially.
Mass Spectrometer
Mass Spectrometer
Our powerful, versatile & proven mass spectrometry solutions deliver a new level of understanding and control in vacuum, gas-related applications, and in research works. This product will give you the result with better accuracy you want.
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