Our Products
Our Products
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Metrosemi offers comprehensive set of metrology systems that allows chip manufacturers to maintain tight control of their processes for improved device performance and yield. We offers metrology and characterization systems for front-end, back-end, as well as research and development applications.
FSM 128L
FSM 128L
Film stress and wafer bow measurement for wafers up to 300mm diameter. 2D/3D stress mapping standard. Semi-automated system with convenient wafer loading and retrieval.
FSM 900TC
FSM 900TC
Rapid Thermal Mechanical Characterization of novel materials. Simulataneous extraction of stress hysteresis, thermal desorption, film shrinkage and reflectivity data during thermal cycling in vaccum up to 900 degree C
FSM 500TC
FSM 500TC
Stress Hysteresis Measurement up to 500C for thermal property and stability tests of thin films in inert gas. Non-Contact Laser Scanning Technology.
Our Partners
Our Partners
Every partner is our strength
Metrology, defect inspection, lithography, and smart manufacturing software solutions for semiconductor manufacturers .
Providing solutions in solutions for semiconductor, LED, Solar, FPD, Data Storage and MEMS applications.
FSM offers a range of advanced metrology products and solutions for semiconductor.
Our Clients
Our Clients
20 years of business experience with semiconductor Fabs and research institutes.
Contact Information
Contact Information
Head Office (USA)
Head Office (USA)
ALAM MO
VP ( Business Development)
(+1) 408-430 2470
ADDRESS
165 Topaz St., Milpitas, CA 95035
Branch Office (Bangladesh)
Branch Office (Bangladesh)
Amol Roy
General Manager (Operation)
(+880) 1712277079
ADDRESS
Wasi Tower, Dhaka-1216, Bangladesh.
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