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In addition to the spatially resolved measurement capabilities listed below, we also have access to a larger number of single-point specialized characterization instruments, to study the most interesting points on the combinatorial libraries in more detail.
X-Ray Diffraction (XRD) Mapping
Bruker D8 Discover XRD
Measures: Structure, phase content
Samples: <4” square
Resolution: 1-2 mm
Time per point: 3-5 min
Features: 2D detector
Publications:
X-Ray Diffraction (XRD) Mapping
Rigaku SmartLab
Measures: structure, phase content
Samples: <6” diameter
Resolution: 1-2 mm
Time per point: 3-5 min
Features: XRR, pole figures, high-resolution XRD
Publications:
X-Ray Fluorescence (XRF) Mapping
Fisher XDV XRF
Measures: Composition, thickness
Samples: <12” square
Resolution: 0.3-3 mm
Time per point: 3-5 min
Features: Ti lightest element
Publications:
X-Ray Fluorescence (XRF) Mapping
Fisher XUV XRF
Measures: Composition, thickness
Samples: <6” square
Resolution: 0.3-3 mm
Time per point: 3-5 min
Features: >Al, vacuum
Publications:
X-Ray Fluorescence (XRF) Mapping
Bruker Tornado XRF
Measures: Composition, thickness
Samples: <6” square
Resolution: 0.01-3 mm
Time per point: 3-5 min
Features: >Al, vacuum, micro
Publications:
Rutherford Backscattering (RBS) Mapping
National Electrostatics Corp RBS
Measures: Composition, thickness
Samples: <2” square
Resolution: 1 mm
Time per point: 30min
Features: >N, vacuum
Publications:
Reflection and Transmission mapping
Ocean Optics Spectrometer
Measures: band gap, absorption coefficient
Samples: <6” square
Resolution: 1 mm
Time per point: 3 sec
Features: diffuse and specular, UV-VIS-NIR
Publications:
Reflection and Transmission FTIR mapping
Thermo Scientific FTIR
Measures: plasmons, vibrations
Samples: <6” square
Resolution: 3 mm
Time per point: 5 sec
Features: 1.8-25 um
Publications:
Raman Scattering and Photoluminescence Mapping
Renishaw in Via Raman Microscope
Measures: vibration modes, phase ID
Samples: <2” square
Resolution: 1 um
Time per point: 5 min
Features: multiple lasers
Publications: https://doi.org/10.1002/aenm.201601935
4-point probe sheet resistance mapping
Custom 4-point probe
Measures: sheet resistance
Samples: 2” square
Resolution: 3 mm
Time per point: 15 sec
Features: heaters for measuring Seebeck
Publications:
JV/CV/IS mapping
Custom JV/CV/IS
Measures: resistance, capacitance, impedance
Samples: <6” square
Resolution: 1 mm
Time per point: 5-30 sec
Features: solar simulator, T/ambient control
Publications:
Spectroscopic Ellipsometry Mapping
J.A. Woollam Ellipsometer
Measures: thickness, refractive index
Samples: <6” square
Resolution: 1 mm
Time per point: 10 sec
Features: variable angle, UV-VIS-NIR
Publications:
Kelvin Probe Mapping
KP Technology
Measures: work function, surface photovoltage
Samples: <6” square
Resolution: 1 mm
Time per point: 10 sec
Features: variable angle, UV-VIS-NIR
Publications:
Scanning Droplet Cell mapping
Custom SDC instrument
Measures: cyclic voltammetry, photocurrent
Samples: <2” square
Resolution: 2 mm
Time per point: 30 sec
Features: corrosion testing, LED-based light
Publications:
Contact angle mapping
Kruss-Scientific
Measures: contact angle
Samples: <6” square
Resolution: 3 mm
Time per point: 15 sec
Features:
Publications:
Photoemission Spectroscopy (XPS) Mapping
Kratos Nova XPS
Measures: Fermi level, work function
Samples: <6” square
Resolution: 1 mm
Time per point: 30 min
Features: vacuum transfer
Publications:
Atomic Force Microscopy (AFM) Mapping
Bruker AFM
Measures: RMS roughness, grain size
Samples: <6” square
Resolution: 1 nm
Time per point: 30 min
Features: vacuum transfer
Publications: in progress
Thickness Profilometry Mapping
Dektak Profilometer
Measures: film thickness
Samples: <6” round
Resolution: 1 um
Time per point: 30 sec
Features:
Publications:
Scanning Colorimetry Mapping
Epson Perfection V850 photo scanner
Measures: film images and color
Samples: <8” square
Resolution: 1 um
Time per point: <1 sec
Features: custom holder and software
Publications:
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