Flash Sintering of Ceramics (2022)
Effects of Electric Field on Microstructure Evolution and Defect Formation in Flash-Sintered TiO2
Yang, B.; Shang, Z.; Li, J.; Phuah, X. L.; Cho, J.; Wang, H.; Zhang, X. Effects of Electric Field on Microstructure Evolution and Defect Formation in Flash-Sintered TiO2. J. Eur. Ceram. Soc. 2022. https://doi.org/10.1016/j.jeurceramsoc.2022.06.009.
Highlights:
Comparison of DC and AC flash sintering methods microstructure and defect distribution
Reverse polarity flash sintering yield homogeneous microstructure with tailorable defect distribution
Wang, H.; Phuah, X. L.; Li, J.; Holland, T. B.; Vikrant, K. S. N.; Li, Q.; Hellberg, C. S.; Bernstein, N.; García, R. E.; Mukherjee, A.; Zhang, X.; Wang, H. Key Microstructural Characteristics in Flash Sintered 3YSZ Critical for Enhanced Sintering Process. Ceram. Int. 2019, 45 (1), 1251–1257. https://doi.org/10.1016/j.ceramint.2018.10.007.
Highlights:
Flash sintering introduced unique characteristics which were not observed in conventional sintered samples
Clusters of adjacent subgrains with similar orientation after flash sintering
High density of dislocation arrays were found near grain boundary triple junction
Wang, H.; Phuah, X. L.; Charalambous, H.; Jha, S. K.; Li, J.; Tsakalakos, T.; Zhang, X.; Wang, H. Staged Microstructural Study of Flash Sintered Titania. Materialia 2019, 8 (100451), 100451. https://doi.org/10.1016/j.mtla.2019.100451.
Highlights:
High density of dislocations and stacking faults in flash sintered titania
Defects density can be controlled by the flash sintering parameters (i.e. electric field, current density and holding time)
Li, J.; Cho, J.; Ding, J.; Charalambous, H.; Xue, S.; Wang, H.; Phuah, X. L.; Jian, J.; Wang, X.; Ophus, C.; Tsakalakos, T.; García, R. E.; Mukherjee, A. K.; Bernstein, N.; Hellberg, C. S.; Wang, H.; Zhang, X. Nanoscale Stacking Fault-Assisted Room Temperature Plasticity in Flash-Sintered TiO2. Sci. Adv. 2019, 5 (9), eaaw5519. https://doi.org/10.1126/sciadv.aaw5519.
Highlights:
Micropillar compression up to 10% strain under room temperature without crack formation
Formation of nanoscale stacking faults and nanotwins due to high density of defects introduced by flash sintering