Lab Facilities
Group Capabilities
Various ceramic, metallic and other thin films processed by pulsed laser deposition (PLD)
Thin film microstructural characterizations using X-ray diffraction (XRD), transmission electron microscopy (TEM), high-resolution TEM (HRTEM), scanning TEM (STEM), and energy-dispersive X-ray spectroscopy (EDS)
Field- and current-assisted sintering techniques (flash sintering and spark plasma sintering)
Equipment
Pulsed laser deposition (PLD)
Lambda Physik COMPex Pro 205 High-Pulse Energy Excimer Laser (KrF)
18 inch laser MBE system
Several additional PLD chambers with features including:
Programmable pumping and deposition control
Programmable and exchangeable 6-target holder
Heated substrate holder
Magnetron sputtering deposition with UHV (2” gun for DC sputtering)
Moving into the new lab at Purdue in 2016!
Initially the lab was messy and then Jijie Huang and Zhimin Qi worked to help install the large and small PLD chambers.
Bulk Sample Processing
Spark plasma sintering (SPS) and dilatometer
Flash sintering
Several furnace tubes
Ceramic bulk processing tools (glove box, ball milling machine, balance, hydrostatic press, tube furnaces and vacuum tube furnace)
X-ray Diffraction (XRD)
PANalytical Empyrean with heating stage
Omega-2Theta Scan Mode
Reciprocal Space Mapping (RSM) Capabilities
Sample Preparation
TEM sample preparation tools
Slow speed saw
Grinder / polisher
Dimpler
Precision ion mill
Transmission Electron Microscopy (TEM)
Thermo Fisher Talos F200X with high resolution TEM, scanning TEM, electron dispersive X-ray spectroscopy, and in situ heating
We had to tear open a wall to move the TEM in! Many people worked together to help carefully move the TEM downstairs and through the hole. The hole was later patched and the TEM was established in its new home! A big thanks to Postdocs. Jin Li, Jie Jian, Jijie Huang, and Sichuang Xue for their help!
Electrical, Optical, and Surface Characterization
Spectroscopic ellipsometry (J. A. Wollam RC2)
Bruker Dimension Icon Atomic- and piezo-force microscopy
UV-vis near-IR spectrophotometer
Electrical measurement systems (I-V, ferroelectric, magnetoelectric, and bulk piezoelectric testers)
In situ nanoindentation, STM, AFM holder system for in situ work in TEM column
KLA Tencor D-600 Profilometer for rough surface topography
Additional Equipment
Electrochemical measurement tools for SOFC
Electrochemical deposition cells and screen printing tool