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Advanced Micro Devices (AMD) is sponsoring the first FTXS best paper award! This award will be chosen by the PC and awarded at FTXS 2015. The prize is a new PlayStation 4!
The FTXS 2015 best paper was awarded to Resilient Matrix Multiplication of Hierarchical Semi-Separable Matrices by Brian Austin, Eric Roman and Xiaoye Li. The runner up was A Principled Approach to HPC Event Monitoring by Alireza Goudarzi, Dorian Arnold, Darko Stefanovic, Kurt Ferreira and Guy Feldman. Brian Austin donated the Playstation 4 to runner up presenter, Alireza Goudarzi.
The 5th Fault Tolerance for HPC at eXtreme Scale (FTXS) 2015
Workshop Keynote
Workshop Keynote
Failures in Large-Scale Systems: Insights from the Field
Sudhanva Gurumurthi
AMD Research, Advanced Micro Devices, Inc.
University of Virginia
ABSTRACT
The use of highly scaled technologies and large component counts pose significant reliability challenges for large-scale systems. Knowledge of failures that occur in such systems is valuable for driving RAS design decisions for component and system vendors, as well as for the operators of those systems in order to improve resilience. Field studies play a key role in providing insights into the types of failures that occur in real systems, especially at scale. This talk will highlight the value of such studies and discuss implications for future exascale systems using data from failure analyses of supercomputers and cloud data centers.
BIO
Sudhanva Gurumurthi is a Senior Researcher at AMD, where he directs projects on resiliency and reliability. He used to be a tenured Associate Professor in the Computer Science Department at the University of Virginia and is currently a Visiting Associate Professor in that department. Sudhanva is a recipient of the NSF CAREER Award and several research awards from the NSF and industry. He received his PhD from Penn State, and is a Senior Member of the IEEE and the ACM.
Workshop Agenda
Workshop Agenda
9 high quality papers plus the Federated Computing Research Conference plenary talk makes for a long day for FTXS 2015!
Submission Essential Information
Submission Essential Information
Submissions are expected in the following categories:
Regular papers presenting innovative ideas improving the state of the art
Experience papers discussing the issues seen on existing extreme-scale systems, including some form of analysis and evaluation
Extended abstracts proposing disruptive ideas in the field, including some form of preliminary results
Authors are invited to submit papers with unpublished, original work of a maximum of eight (8) pages for normal papers and six (6) pages for position papers. Please follow the US Letter guidelines for ACM Proceedings Style.
Papers will be peer-reviewed, and accepted papers will be published in the workshop proceedings as part of the IEEE digital library. Submission implies the willingness of at least one of the authors to register and present the paper.
Important Dates
Important Dates
Submission of papers: February 9th, 2015 February 17th, 2015 (EXTENDED, NOW FIRM DEADLINE)
Author notification: March 9th, 2015 (this date may shift due to submission extension)
Camera ready papers: April (TBA), 2015
Workshop: June 15th, 2015
Workshop Topics
Workshop Topics
Topics include, but are not limited to:
Failure data analysis and field studies
Power, performance, resilience (PPR) assessments / tradeoffs
Novel fault-tolerance techniques and implementations
Emerging hardware and software technology for resilience
Silent data corruption (SDC) detection / correction techniques
Advances in reliability monitoring, analysis, and control of highly complex systems
Failure prediction, error preemption, and recovery techniques
Fault-tolerant programming models
Models for software and hardware reliability
Metrics and standards for measuring, improving, and enforcing effective fault-tolerance
Scalable Byzantine fault-tolerance and security from single-fault and fail-silent violations
Atmospheric evaluations relevant to HPC systems (terrestrial neutrons, temperature, voltage, etc.)
Near-threshold-voltage implications and evaluations for reliability
Benchmarks and experimental environments including fault injection
Frameworks and APIs for fault-tolerance and fault management
Workshop Organizers / Program Chairs
Workshop Organizers / Program Chairs
Nathan DeBardeleben - Los Alamos National Laboratory
Franck Cappello - Argonne National Laboratory and the University of Illinois at Urbana Champaign
Robert Clay - Sandia National Laboratories
Program Committee
Program Committee
Leonardo Bautista Gomez – Argonne National Laboratory
Aurélien Bouteiller – University of Tennessee Knoxville
Greg Bronevetsky - Lawrence Livermore National Laboratory
John Daly - Department of Defense
Christian Engelmann – Oak Ridge National Laboratory
Kurt Ferreira – Sandia National Laboratories
Ana Gainaru – University of Illinois at Urbana-Champaign
Qiang Guan – Los Alamos National Laboratory
Saurabh Gupta – Oak Ridge National Laboratory
Saurabh Hukerikar – Information Sciences Institute/USC
Hideyuki Jitsumoto – Tokyo Institute of Technology
Zhiling Lan – Illinois Institute of Technology
Scot Levy – University of New Mexico
Naoya Maruyama – RIKEN AICS
Bogdan Nicolae – IBM Research – Ireland
Thomas Ropars - EPFL
Yves Robert - ENS Lyon
Anthony Skjellum - Auburn University
Vilas Sridharan – AMD, Inc.
Devesh Tiwari – Oak Ridge National Laboratory
Abhinav Vishnu - Pacific Northwest National Laboratory
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