FTXS 2012 - Boston, MA

The 2nd Fault Tolerance for HPC at eXtreme Scale (FTXS) 2012

SUBMISSION DEADLINE EXTENDED: March 24, 2012 - 11:59 PM EST (FINAL DEADLINE EXTENSION!)

Workshop Agenda

Below (slides) and (REFerences) are linked where available.

Submission Essential Information

Submissions are expected in the following categories:

• Regular papers presenting innovative ideas improving the state of the art

• Experience papers discussing the issues seen on existing extreme-scale systems, including some form of analysis and evaluation

• Extended abstracts proposing disruptive ideas in the field, including some form of preliminary results

Submissions shall be sent electronically, must conform to IEEE conference proceedings style and should not exceed six pages including all text, appendices, and figures. US Letter format, not A4.

All papers will be published, as workshop papers, in the DSN 2012 proceedings and on IEEE Xplore.

Submit a paper here.

Authors are invited to submit papers with unpublished, original work of not more than 8 pages of double column text using single spaced 10 point size on 8.5 x 11 inch pages (including all text, figures, and references), as per ACM 8.5 x 11 manuscript guidelines (document templates can be found at http://www.acm.org/sigs/publications/proceedings-templates).

Papers will be peer-reviewed, and accepted papers will be published in the workshop proceedings as part of the ACM digital library. Submission implies the willingness of at least one of the authors to register and present the paper.

Submit a paper here.

Important Dates

Submission of papers: March 16, 2012 March 24, 2012 - 11:59 PM EST (DEADLINE EXTENDED!)

Author notification: April 13, 2012

Camera ready papers: April 27, 2012

Workshop: June 25, 2012

Workshop Topics

Assuming hardware and software errors will be inescapable at extreme scale, this workshop will consider aspects of fault tolerance particular to extreme scale that include, but are not limited to:

• • • Quantitative assessments of cost in terms of power, performance, and resource impacts of fault-tolerant techniques, such as checkpoint restart, that are redundant in space, time or information

    • Novel fault-tolerance techniques and implementations of emerging hardware and software technologies that guard against silent data corruption (SDC) in memory, logic, and storage and provide end-to-end data integrity for running applications

    • Studies of hardware / software tradeoffs in error detection, failure prediction, error preemption, and recovery

    • Advances in monitoring, analysis, and control of highly complex systems

    • Highly scalable fault-tolerant programming models

    • Metrics and standards for measuring, improving and enforcing the need for and effectiveness of fault-tolerance

    • Failure modeling and scalable methods of reliability, availability, performability and failure prediction for fault-tolerant HPC systems

    • Scalable Byzantine fault tolerance and security from single-fault and fail-silent violations

    • Benchmarks and experimental environments, including fault-injection and accelerated lifetime testing, for evaluating performance of resilience techniques under stress

Workshop Organizers

Nathan DeBardeleben - Los Alamos National Laboratory

Jon Stearley - Sandia National Laboratory

Franck Cappello - INRIA and University of Illinois at Urbana Champaign

Program Committee

George Bosilca - University of Tennessee, Knoxville

Greg Bronevetsky - Lawrence Livermore National Laboratory

John Daly - Department of Defense

Christian Engelmann - Oak Ridge National Laboratory

Kurt Ferreira - Sandia National Laboratories

Ana Gainaru - University of Illinois, Urbana-Champaign

Hideyuki Jitsumoto - University of Tokyo

Zbigniew Kalbarczyk - University of Illinois, Urbana-Champaign

Rakesh Kumar - University of Illinois, Urbana-Champaign

Zhiling Lan - Illinois Institute of Technology

Bogdan Nicolae - INRIA

Yve Robert - ENS Lyon

Roel Wuyts - (Intel ExaScience Lab, Leuven, Belgium) and KU Leuven (Leuven, Belgium)

Felix Salfner - SAP Innovation Center Potsdam

Mitsuhisa Sato - University of Tsukuba

Stephen Scott - Oak Ridge National Laboratory and Tennessee Tech University

Questions?

Please address FTXS workshop questions to Nathan DeBardeleben, Los Alamos National Laboratory (ndebard@lanl.gov)