FTXS 2013 - New York City, NY

The 3rd Fault Tolerance for HPC at eXtreme Scale (FTXS) 2013

SUBMISSION DEADLINE EXTENDED: February 18, 2013 - 11:59 PM EST (FINAL DEADLINE EXTENSION!)

Workshop Agenda

Presenter is underlined, (slides) and (REFerences) are linked where available.

Submission Essential Information

Submissions are expected in the following categories:

• Regular papers presenting innovative ideas improving the state of the art

• Experience papers discussing the issues seen on existing extreme-scale systems, including some form of analysis and evaluation

• Extended abstracts proposing disruptive ideas in the field, including some form of preliminary results

Authors are invited to submit papers with unpublished, original work of not more than 8 pages of double column text using single spaced 10 point size on 8.5 x 11 inch pages (including all text, figures, and references), as per ACM 8.5 x 11 manuscript guidelines (document templates can be found at http://www.acm.org/sigs/publications/proceedings-templates).

Papers will be peer-reviewed, and accepted papers will be published in the workshop proceedings as part of the ACM digital library. Submission implies the willingness of at least one of the authors to register and present the paper.

Submit a paper here.

Important Dates

Submission of papers: February 11, 2013 February 18, 2013 - 11:59 PM EST (DEADLINE EXTENDED!)

Author notification: March 18, 2013

Camera ready papers: April 15, 2013

Workshop: June 18, 2013

Workshop Topics

Assuming hardware and software errors will be inescapable at extreme scale, this workshop will consider aspects of fault tolerance particular to extreme scale that include, but are not limited to:

• • • Quantitative assessments of cost in terms of power, performance, and resource impacts of fault-tolerant techniques, such as checkpoint restart, that are redundant in space, time or information

    • Novel fault-tolerance techniques and implementations of emerging hardware and software technologies that guard against silent data corruption (SDC) in memory, logic, and storage and provide end-to-end data integrity for running applications

    • Studies of hardware / software tradeoffs in error detection, failure prediction, error preemption, and recovery

    • Advances in monitoring, analysis, and control of highly complex systems

    • Highly scalable fault-tolerant programming models

    • Metrics and standards for measuring, improving and enforcing the need for and effectiveness of fault-tolerance

    • Failure modeling and scalable methods of reliability, availability, performability and failure prediction for fault-tolerant HPC systems

    • Scalable Byzantine fault tolerance and security from single-fault and fail-silent violations

    • Benchmarks and experimental environments, including fault-injection and accelerated lifetime testing, for evaluating performance of resilience techniques under stress

Workshop Organizers

Nathan DeBardeleben - Los Alamos National Laboratory

Jon Stearley - Sandia National Laboratory

Franck Cappello - INRIA and University of Illinois at Urbana Champaign

Program Committee

Rob Aulwes – Los Alamos National Laboratory

Aurélien Bouteiller – University of Tennessee, Knoxville

Greg Bronevetsky - Lawrence Livermore National Laboratory

Clayton Chandler – Department of Defense

Robert Clay – Sandia National Laboratories

John Daly - Department of Defense

Christian Engelmann – Oak Ridge National Laboratory

Felix Salfner - SAP Innovation Center Potsdam

Kurt Ferreira – Sandia National Laboratories

Ana Gainaru – University of Illinois at Urbana-Champaign

Leonardo Bautista Gomez – Tokyo Institute of Technology

Hideyuki Jitsumoto – The University of Tokyo

Rakesh Kumar - University of Illinois, Urbana-Champaign

Zhiling Lan – Illinois Institute of Technology

Naoya Maruyama – Tokyo Institute of Technology

Kathryn Mohror – Lawrence Livermore National Laboratory

Bogdan Nicolae – IBM Research – Ireland

Rolf Riesen – IBM Research – Ireland

Yve Robert - ENS Lyon

Thomas Ropars - EPFL

Mitsuhisa Sato – University of Tsukuba

Stephen Scott – Tennessee Tech University and Oak Ridge National Laboratory

Vilas Sridharan – AMD, Inc.

Roel Wuyts - Intel ExaScience Lab

Questions?

Please address FTXS workshop questions to Nathan DeBardeleben, Los Alamos National Laboratory (ndebard@lanl.gov)