Electron Microscopy for Materials Science (全英文课程)
Audience: Graduate students from MSE, Chemistry, Physics, Optoelectronics, and Polymer Science, including some of Westlake University
Description: This flagship course was originally co-developed with Prof. Jun Yuan (University of York, UK). It provides a comprehensive and rigorous foundation in electron microscopy. Since 2019, it has been offered biennially in English, maintaining a high standard of international academic training.
本课程由本课题组与英国约克大学 Jun Yuan 教授共同开发，面向材料、物理、光电及高分子等专业的博士及硕士研究生，旨在建立扎实的显微学理论基础，全程英文授课。
Scanning Electron Microscopy (SEM)
Platform: Hunan Institute of Advanced Sensing and Information Technology, Xiangtan University.
Description: A specialized course focusing on the principles and advanced applications of SEM in sensing and information technologies.
面向湖南先进传感与信息技术研究院（湘潭大学）一年级研究生的专业课程，重点讲解扫描电子显微技术及其在传感信息领域的应用。
Materials Characterization III | 材料b表征 (III)
Audience: 3rd-year Undergraduate Students, School of Materials Science and Engineering (MSE), ZJU.
Description: As a core module of the materials curriculum, Prof. Jin leads the sections on SEM, FIB, X-ray, FEM, APT, AFM, and STM. The course bridges fundamental theory with modern characterization toolsets, providing students with a broad perspective on micro-to-nano scale analysis.
作为材料专业核心课程，金传洪教授负责扫描电镜（SEM）、聚焦离子束（FIB）、X射线分析、场发射显微镜（FEM）、原子探针（APT）及扫描探针显微镜（AFM/STM）等模块的教学，致力于培养学生从微观到纳米维度的综合分析能力。
Physical Principles of Electron Microscope (2013)
This introductory course was specially delivered by the world-renowned physicist Prof. Ray Egerton (University of Alberta, Canada). It is currently under strategic re-design to better integrate with the evolving frontiers of carbon-based electronics and modern microscopy.
该课程曾特邀加拿大阿尔伯塔大学、显微学泰斗 Ray Egerton 教授主讲。目前课程处于重新规划与建设阶段，以期更紧密地结合碳基电子学等前沿领域。