[Overview / 个人综述]
Prof. Chuanhong Jin (金传洪) is a Professor in the School of Materials Science and Engineering at Zhejiang University, where he also serves as the Vice Director of the Center for Electron Microscopy. With a dual appointment at the Peking University Chongqing Research Institute of Carbon-based Integrated Circuits, Prof. Jin seamlessly integrates fundamental microscopy research with the industrial-scale advancement of carbon electronics.
His research operates at the critical intersection of advanced electron microscopy and carbon-based nanoelectronics. He primarily focuses on the multi-scale characterization—spanning from wafer-scale metrology down to atomic-level structural analysis—of aligned carbon nanotube (A-CNT) thin films and their devices. Prof. Jin leads high-impact initiatives aimed at establishing robust CMOS processes based on carbon nanotubes through precise metrology and interface analysis.
金传洪，现任浙江大学材料科学与工程学院教授、浙江大学电子显微镜中心副主任。同时，他兼任北京大学重庆碳基集成电路研究院集成电路测试分析部部长。金教授致力于将基础电子显微学研究与工业级碳基纳电子学的产业化推进深度融合。
他的研究立足于先进电子显微学与碳基纳米电子学的交叉前沿，主要聚焦于阵列碳纳米管（A-CNT）薄膜的跨尺度表征——从晶圆级计量到原子级结构分析。通过精准的计量技术与严谨的界面物理分析，金教授正带领团队全力推进基于碳纳米管的标准化 CMOS 工艺的发展。
[Professional Appointments / 学术任职]
Professor / Vice Director, Center for Electron Microscopy, Zhejiang University
Head of IC Testing Department / Adjunct Professor, Peking University Chongqing Research Institute of Carbon-based Integrated Circuits, Chongqing
Adjunct Professor, Hunan Institute of Advanced Sensing and Information Technology, Xiangtan University, Xiangtan, Hunan
Adjunct Professor, Shanghai Innovation Center for Advanced Materials, Shanghai
[Research Leadership & Impact / 研究影响]
Prof. Jin has authored or co-authored approximately 300 peer-reviewed papers in highly prestigious journals, including Science, Nature Electronics, Nature Communications, and Nano Letters. His research group is at the global forefront of developing cross-scale analytical frameworks for carbon-based electronics, with a focus on:
Wafer-Scale Metrology of Aligned CNTs: Developing comprehensive characterization systems and evaluation protocols for 8-inch aligned carbon nanotube (A-CNT) wafers, ensuring material quality and uniformity for next-generation integrated circuits.
Multi-scale Advanced Characterization: Establishing advanced metrology methodologies that bridge the gap from macro-scale wafer inspection to atomic-level structural analysis.
Interfacial Physics: Quantitatively investigating the gate-stack and contact interfaces in A-CNT CMOS devices using high-resolution in situ TEM/SEM to reveal the physical mechanisms governing device performance.
金传洪小组在 Science, Nature Electronics, Nature Communications, Nano Letters 等国际顶尖学术期刊上发表了约 300 篇同行评审论文。他的课题组在碳基电子学跨尺度分析框架的开发方面处于全球领先地位，核心研究方向包括：
阵列碳纳米管的晶圆级计量： 为 8 英寸阵列碳纳米管（A-CNT）晶圆开发全面的表征系统与严格的评估标准，确保下一代集成电路所需的材料质量与高度均匀性。
跨尺度先进表征： 建立从宏观晶圆级检测到纳米材料原子级结构分析的先进计量方法学。
微纳器件界面物理： 利用高分辨率原位（in situ）TEM/SEM 定量研究 A-CNT CMOS 器件中的栅极堆叠与接触界面，揭示决定器件性能的底层物理机制。
[Academic Appointments / 学术教职]
2011.05 – Present | Professor / Vice Director
Center for Electron Microscopy, School of Materials Science and Engineering, Zhejiang University, China
2010.10 – 2011.05 | Staff Scientist
National Institute of Advanced Industrial Science and Technology (AIST), Japan, Host: Prof. Dr. Sumio Iijima & Kazu Suenaga
日本 国立产业技术综合研究所 (AIST) 研究员, 合作导师：饭岛澄男、末永和知
2006.10 – 2010.09 | Postdoctoral Fellow
National Institute of Advanced Industrial Science and Technology (AIST), Japan
日本 国立产业技术综合研究所 (AIST) 博士后
[Education / 教育背景]
Ph.D. in Condensed Matter, Institute of Physics, CAS, Beijing, 2006
B.S. in Materials Science and Engineering, Tsinghua University, 2001