Speakers
Keynote Speaker
The Oxide Nano Electronics Laboratory, University of California Riverside, USA
Helium ion beam modification of high transition temperature superconducting materials
Applications of the helium ion microscopy to graphene nano-patterning and cell observation
Invited Speaker
Advanced Instrumentation for Ion Nano-Analytics, Luxembourg Institute of Science and Technology (LIST), Luxembourg
Analytical capabilities on FIB instruments using SIMS: applications, current developments and prospects
Carl Zeiss AG, Germany
SIMS applications on the Orion NanoFab
Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Germany
Helium ion microscope imaging and time-of-flight secondary ion mass spectrometry depth profiling of sample cross sections
Miika Leppänen (PhD Student)
Nanoscience Center, University of Jyväskylä, Finland
Helium ion microscope experiments on the biological materials
AMCASH, School of Metallurgy & Materials University of Birmingham, UK
Applications of Xe+ Plasma FIB in sample preparation, 3D characterisation and in-situ mechanical test
Eduardo Serralta (PhD Student)
Institute of Ion Beam Physics and Materials Research, Helmholtz-Zentrum Dresden-Rossendorf, Germany
New detection system for transmission imaging in the helium ion microscope
Department of Mechanical Engineering Sciences, University of Surrey, UK
Revealing the structure-function relationship of engineering materials using advanced correlative microscopy
Bin Zhu (PhD Student)
Department of Mechanical Engineering Sciences, University of Surrey, UK
Multi-scale residual strain in as-welded Eurofer97 steel measured by Xe+ plasma focused ion beam and digital image correlation (PFIB-DIC) and neutron Bragg edge imaging