Advances in Gas-Ion Microscopy

The 2nd International Workshop of the PicoFIB Network

UCL, London 13.2.2019

The meeting gathered together current and potential users of gas-ion microscopy from 15 different institutes and explored the latest technological developments and applications of Helium, Neon, and Xenon FIB technologies.

Invited Speaker

  • Dr Olga S. Ovchinnikova, Oak Ridge National Laboratory, USA

Research Themes

  • Correlative nanoanalytics, nano-spectroscopy, and gas-ion SIMS
  • Materials applications of gas-ion FIB
  • Fundamentals and modelling of gas ion-solid interactions
  • Advances in gas-ion microscopy instrumentation
  • Optimising methodologies: tips & tricks

Meeting Organisers

PicoFIB network partners: The University of Sheffield and University College London

Invited Speaker the event, Dr Olga Ovchinnikova from Oak Ridge National Laboratory, talked about correlated materials characterisation via chemical and functional imaging.

Programme

Olga S. Ovchinnikova, Oak Ridge National Laboratory, USA

Correlated Materials Characterization via Multimodal Chemical and Functional Imaging


Nico Klingner, Institute of Ion Beam Physics and Materials Research, HZDR, Germany

The Race against Time: TOF-SIMS in the HIM


José María De Teresa, CSIC, University of Zaragoza, Spain

Tunable W-C Nanotube Diameter by He+ Focused Ion Beam Induced Deposition


Jamie Potter, London Centre for Nanotechnology, UCL, UK

Embedding NbN Nanowires in Coplanar Waveguide Resonators Using a Neon Focused Ion Beam


Lothar Bischoff, Institute of Ion Beam Physics and Materials Research, HZDR, Germany

Mass Separated Focused Ion Beams from Liquid Metal Alloy Ion Sources


Pablo Orús, CSIC, University of Zaragoza, Spain

Vortex Transport in Superconducting W-C Nanostructures

Laura Wheatcroft, Department of Materials Science and Engineering, University of Sheffield, UK

He-ion Microscopy and Ne Secondary Ion Mass Spectroscopy of High Voltage Li-ion Cathode Materials


Nathan Cassidy, Surrey Ion Beam Centre, University of Surrey, UK

Duoplasmatron FIB for Deterministic Ion Implantation


Jakub Jadwiszczak, CRANN & AMBER Research Centres, Trinity College Dublin, Ireland

Single-layer Neuromorphic MoS2 Memtransistors Fabricated by Helium Ion Beam Irradiation


Stuart Boden and Tudor Scheul, School of Electronics and Computer Science, University of Southampton, UK

Helium Ion Microscopy of Nanostructured Black Silicon


Xiaomo Xu, Institute of Ion Beam Physics and Materials Research, HZDR, Germany

Towards a Vertical Nanopillar-based Single Electron Transistor – a High-temperature Ion Beam Irritation Approach

Eduardo Serralta, Institute of Ion Beam Physics and Materials Research, HZRD, Germany

Development of a Dedicated System for Scanning Transmission Helium Ion Microscopy


Nicholas Farr, Department of Materials Science and Engineering, University of Sheffield, UK

Secondary Electron Spectrometry – Helping to See the Truth about Your Sample?


Helen Jones, National Physical Laboratory, University of Surrey, UK

Metrological Comparison Between Gallium and Xenon FIB in Materials Processing


Ian MacLaren, School of Physics and Astronomy, University of Glasgow, UK

Why Cryo-FIB Thinning is Essential for Preparing AISb-containing Semiconductor, Heterostructures


Kai Arstila, Department of Physics, University of Jyväskylä, Finland

Atomic Force Microscopy of HIM Milled Bevels of Thin Films and Nanostructures

The second international PicoFIB network meeting was held at Roberts Building, UCL, in London.
Sharing ideas and opinions over the coffee.
The event was sponsored by the Leverhulme Trust, ZEISS, and Thermo Fisher Scientific.