Session 1 - Nanofabrication

Chair: Paul Warburton (UCL, UK)

Jose Maria De Teresa (CSIC-University of Zaragosa)

Spain Superconducting crystalline nanotubes vertically grown by He+ focused ion beam induced deposition

Gregor Hlawacek (HZDR, Germany)

Localized ion beam mixing using a focused Neon beam for future SET applications

Oscar Kennedy (University College London, UK)

Nanoscale superconducting devices fabricated by neon-FIB

Daniel Emmerich (Bielefeld University, Germany)

Writing Magnetic Domains with a Helium Ion Microscope

Darragh Keane (Trinity College Dublin, Ireland)

He+-beam induced memristive behaviour in 2D MoS2

Session 2 - Fundamentals and Imaging

Chair: Jose Maria De Teresa (CSIC-Uni. of Zaragosa)

Wolfhard Möller (HZDR, Germany)

Binary Collision Computer Simulation of FIB Induced Erosion and Damage in Nanostructures

Xiangli Zhong (University of Manchester, UK)

Advances of Using Xe+ Plasma Focused Ion Beam for TEM Sample Preparation of Aluminium Samples

Stuart Boden (University of Southampton, UK) Helium ion microscopy of antireflective surfaces

Adam Baggott (University of Sheffield, UK)

A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride

Mathias Schmidt (UFZ, Germany)

Correlative Microscopy with Light, Electrons and Ions in Environmental Microbiology.

Session 3 - Instrumentation

Chair: Gregor Hlawacek (HZDR, Germany)

Tom Wirtz (LIST, Luxembourg)

SIMS on Helium Ion Microscope: prospects for highest spatial resolution imaging and correlative microscopy

Nico Klingner (HZDR, Germany )

Time of flight secondary ion mass spectrometry in the helium ion microscope at the HZDR

Robert Masters (University of Sheffield, UK)

Characterising organic materials in the HIM: Paving the way for new applications with secondary electron spectroscopy

Peter Gnauck (Carl Zeiss, Germany)

News on the Orion NanoFab

Kai Arstila (University of Jyväskylä, Finland)

Effect of acoustic interference to HIM resolution