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Sample in a magnet holder facing objective lens
PEEM-3 endstation with preparation and analysis chamber on the left
XYZ stage with X and Y tilt (5 moving axis in total, with high resolution peizo motors)
Cooling reaches around 30 K with liquid helium, 110 K with liquid nitrogen (measured at the sample)
Argon ions flooding the sample surface at the prep chamber (we can use ion gun for sputter clean the sample or etch the surface. Energy can be tuned up to 5 keV)
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