PEEM-3 endstation

Photoemission electron microscopy (PEEM) 

Photoemission Electron Microscopes (PEEM's) record electrons emitted from a sample in response to the absoprtion of ionizing radiation. The electrons are accelerated by a strong electric field between the sample and the outer electrode of the objective lens, and the image is magnified hundred- or thousand-fold by a series magnetic or electrostatic electron lenses. An electron-sensitive detector records the electron emission.

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PEEM-3 is an aberration corrected photoemission electron microscope at beamline 11.0.1.1 of the Advanced Light Source.

Currently, PEEM-3 reaches down to 30 nm spatial resolution while the aberration correction is being commissioned. PEEM-3 is optimized for the study of the chemistry, structure and magnetism of thin films and surfaces, offers a very flexible sample environment with temperatures between 30 K and 1000 K, magnetic fields, short current and voltage pulses, and space for large samples or custom sample holders. The beamline uses an elliptically polarizing undulator with full polarization control and adjustable KB-optics to match the x-ray spot size to the field of view of the microscope. Sample transfer from loadlock to microscope is fully automated.