PEEM-3 endstation

Photoemission electron microscopy (PEEM) 

Photoemission Electron Microscopes (PEEM's) record electrons emitted from a sample in response to the absoprtion of ionizing radiation. The electrons are accelerated by a strong electric field between the sample and the outer electrode of the objective lens, and the image is magnified hundred- or thousand-fold by a series magnetic or electrostatic electron lenses. An electron-sensitive detector records the electron emission.

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PEEM-3 is a photoemission electron microscope at beamline 11.0.1.1 of the Advanced Light Source.

Currently, PEEM-3 reaches down to 50 nm spatial resolution. PEEM-3 is optimized for the study of the chemistry, structure and magnetism of thin films and surfaces, offers a very flexible sample environment with temperatures between 30 K and 800 K, magnetic fields, short current/voltage pulses, azimuth rotation (RT and low T = ~35K), and space for large samples or custom sample holders. The beamline uses an elliptically polarizing undulator with full polarization control and adjustable KB-optics to match the x-ray spot size to the field of view of the microscope. Sample transfer from loadlock to microscope is fully automated.