PUBLICATIONS

“External removal of endpoint-discontinuity artifacts in the reciprocal-space analysis of spectra”

V.L. Le, T.J. Kim, Y.D. Kim, D.E. Aspnes

Current Applied Physics, Vol. 20, Issue 1, January 2020, pp. 232-236

“Temperature dependence of the dielectric function of monolayer MoS₂”

V.L. Le, T.J. Kim, H.G. Park, H.T. Nguyen, X.A. Nguyen, and Y.D. Kim

Current Applied Physics, Vol. 19, Issue 2, 01 February 2019, pp. 182~187

“Treatment of Surface Plasmon Resonance (SPR) Background in Total Internal Reflection Ellipsometry: Characterization of RNA Polymerase II Film Formation”

Dusan Hemzal, Yu Ri Kang, Jan Dvorak, Tomasz Kabzinski, Karel Kubıcek , Young Dong Kim, and Josef Humlıck

Applied Spectroscopy, Vol. 73, Issue 3, 20 February 2019, pp. 261–270

“Dielectric Functions and Critical Points of GaAsSb Alloys”

Tae Jung Kim, Han Gyeol Park, Jun Seok Byun, Van Long Le, Hoang Tung Nguyen, Xuan Au Nguyen, Young Dong Kim, Jin Dong Song, and David E. Aspnes

Journal of the Korean Physical Society, Vol. 74, 01 March 2019, pp. 595~599

“Sub-microsecond response time deep-ultraviolet photodetectors using α-Ga₂O₃ thin films grown via low-temperature atomic layer deposition”

Seung Hyun Lee, Kang Min Lee, Young-Bin Kim, Yoon-Jong Moon, Soo Bin Kim, Dukkyu Bae, Tae Jung Kim, Young Dong Kim, Sun-Kyung Kim, and Sang Woon Lee

Journal of Alloys and Compounds, Vol. 780, 05 April 2019, pp. 400~407

“Linear and nonlinear filtering of spectra”

David E. Aspnes, Van L. Le, and Young D. Kim

Journal of Vacuum Science & Technology, Vol. 37, Issue 5, 05 September 2019, pp. 051205

“Combined interpolation, scale change, and noise reduction in spectral analysis”

Van L. Le, Tae J. Kim, Young D. Kim, and David E. Aspnes

Journal of Vacuum Science & Technology, Vol. 37, Issue 5, 10 September 2019, pp. 052903

“Multi-photoactive quantum-dot channels for zinc oxide phototransistors by a surface-engineering patterning process”

SoonkyuCha, ShinyoungJeong, Byung JunKim, Seong JunKang, Young DongKim, Il KiHan

Current Applied Physics, Vol. 19, Issue 9, September 2019, pp. 992-997

“A Parametric Model for Temperature Dependence of Dielectric Function of AlSb Film”

Xuan Au Nguyen, Tae Jung Kim, Van Long Le, Han Gyeol Park, Hoang Tung Nguyen, and Young Dong Kim

Journal of Nanoscience and Nanotechnology, Vol. 19, No.10, 01 October 2019, pp. 6801~6807

“Parameterized optical properties of monolayer MoSe2”

Tae Jung Kim, Han Gyeol Park, Van Long Le, Hoang Tung Nguyen, Xuan Au Nguyen,

and Young Dong Kim

AIP Advances, Vol 9, Issue 12, 23 December 2019, pp. 125132

“Optical Properties of GaFeO₃”

Tae Jung Kim, Han Gyeol Park, Van Long Le, Hwa Seob Kim, Chang Hyun Yoo, Hyoung Uk Kim, Young Dong Kim, Chang Bae Park, Kwangwoo Shin, and Kee Hoon Kim

Science of Advanced Materials, Vol. 10, No. 2, 1 February 2018, pp. 302~307

“Temperature Dependence of the Dielectric Function of Monolayer MoSe₂”

Han Gyeol Park, Tae Jung Kim, Farman Ullah, Van Long Le, Hoang Tung Nguyen, Yong Soo Kim, and Young Dong Kim

Scientific Reports, Vol. 8, 16 February 2018, pp. 3173

“Multifunctional Bilayer Template for Near-Infrared-Sensitive Organic Solar Cells”

Hyungchae Kim, Han Gyeol Park, Min-Jae Maeng, Yu Ri Kang, Kyung Ryoul Park, Junho Choi, Youngsup Park, Young Dong Kim, and Changsoon Kim

ACS Applied Materials and Interfaces, Vol. 10, Issue 19, 16 May 2018, pp. 16681~16689

“How a Fano Resonance Crosses the Mobility Edge in Quantum Waveguides”

Y. S. Joe, V. Vargiamidis, A. M. Satanin, E. R. Hedin, and Y. D. Kim

Journal of Experimental and Theoretical Physics, Vol. 126, Issue 6, 01 June 2018, pp. 705~711

“Dielectric function, critical points, and Rydberg exciton series of WSe₂ monolayer”

M. S. Diware, S. P. Ganorkar, K. Park, W. Chegal, H. M. Cho, Y. J. Cho, Y. D. Kim, and H. Kim

Journal of Physics: Condensed Matter, Vol. 30, No. 23, 13 June 2018, pp. 6321~6325

“Pt/Alumina Hyperbolic Metafilms with High-Temperature Stability, Wide Wavelength Tunability, and Omnidirectional Absorption”

Tae-Il Lee, Jin-Woo Cho, Dasol Jeong, Kyung-Joon Lee, Bo-Young Park, Tae Jung Kim,

Young Dong Kim, Young-Seok Kim, Yungsuk Nam, and Sun-Kyung Kim

Physica Status Solidi A, Vol. 215, Issue 14, 24 July 2018, pp. 1800287 (7pp)

“Growth of pure wurtzite InGaAs nanowires for photovoltaic and energy harvesting applications”

H.-K. Kanga, J.Y. Kim, M.-S. Noh, C.-Y. Kang, Y.D. Kim, M.-H. Choa, J.D. Song

Nano Energy, Vol. 53, 17 August 2018, pp. 57~65

“Temperature Dependence of the Dielectric Response and Critical Point Energies of Bi_1.85Gd_0.15Te₃”

Hoang Tung Nguyen, Tae Jung Kim, Han Gyeol Park, Van Long Le, Jinsu Kim, Myung-Hwa Jung, and Young Dong Kim

Journal of Nanoscience and Nanotechnology, Vol. 18, 01 September 2018, pp. 235701(6pp)

“Long-distance transmission of broadband near-infrared light guided by a semi-disordered 2D array of metal nanoparticles”

Hyounguk Kim, Kinam Jung, Seon Ju Yeo, Wonseok Chang, Jeong Je Kim, Kwanil Lee, Young Dong Kim, Il Ki Han, and S. Joon Kwon

Nanoscale, Vol. 10, 07 December 2018, pp. 21275~21283

“Thermal and Electric-Field Annealing Effects on the Optical Properties of PTB7:PC₇₁BM Films for Organic Photovoltaics”

Han Gyeol Park, Mangesh S. Diware, Tae Jung Kim, Yu Ri Kang, Jae Chan Park, Koo Hyun Nam, and Young Dong Kim

Science of Advanced Materials, Vol. 9, No. 5, 1 January 2017, pp. 45~51

“Characterization of wafer-scale MoS₂ and WSe₂ 2D films by spectroscopic ellipsometry”

Mangesh S. Diware, Kyunam Park, Jihun Mun, Han Gyeol Park, Won Chegal, Yong Jai Cho, Hyun Mo Cho, Jusang Park, Hyungjun Kim, Sang-Woo Kang, and Young Dong Kim

Current Applied Physics, Vol. 17, Issue 10, 1 October 2017, pp. 1329~1334

“Temperature Dependence of the Optical Properties of SrTiO₃ by Spectroscopic Ellipsometry”

Han Gyeol Park, Tae Jung Kim, Mangesh S. Diware, Van Long Le, Hwa Seob Kim, Chang Hyun Yoo, and Young Dong Kim

Science of Advanced Materials, Vol. 9, No. 11, 1 November 2017, pp. 1937~1941

“Temperature dependence of the critical points of monolayer MoS₂ by ellipsometry”

Han Gyeol Park, Tae Jung Kim, Hwa Seob Kim, Chang Hyun Yoo, Nilesh S. Barange, Van Long Le, Hyoung Uk Kim, Velusamy Senthilkumar, Chinh Tam Le, Yong Soo Kim, Maeng-Je Seong, and Young Dong Kim

Applied Spectroscopy Reviews, Vol. 51, No. 6, 22 March 2016, pp.621~635

“Monitoring of the Binding Between EGFR Protein and EGFR Aptamer Using In-Situ Total Internal Reflection Ellipsometry”

Yu Ri Kang, Jun Seok Byun, Tae Jung Kim, Han Gyeol Park, Jae Chan Park, Nilesh Barange, Koo Hyun Nam, and Young Dong Kim

Journal of Nanoscience and Nanotechnology, Vol. 16, No. 6, 1 June 2016, pp.6445~6449

“Optical Characterization of the PtSi/Si by Using Spectroscopic Ellipsometry”

Van Long Le, Tae Jung Kim, Han Gyeol Park, Hwa Seob Kim, Chang Hyun Yoo, Hyoung Uk Kim, Young Dong Kim, Junsoo Kim, Solyee Im, Won Chul Choi, Seung Eon Moon, and Eun Soo Nam

Journal of the Korean Physical Society, Vol. 69, No. 3, 1 August 2016, pp. 291~296

“Ordered Nanoscale Heterojunction Architecture for Enhanced Solution-Based CuInGaS₂ Thin Film Solar Cell Performance”

Nilesh Barange, Van Ben Chu, Minwoo Nam, In-Hwan Ahn, Young Dong Kim, Il Ki Han, Byoung Koun Min, and Doo-Hyun Ko

Advanced Energy Materials, Vol. 6, Issue 24, 21 December 2016, pp. 1601114

“Direct electron injection into an oxide insulator using a cathode buffer layer”

Eungkyu Lee, Jinwon Lee, Ji-Hoon Kim, Keon-Hee Lim, Jun Seok Byun, Jieun Ko, Young Dong Kim, Yongsup Park and Youn Sang Kim

Nature Communications, Vol.6, 13 April 2015, p. 6785

“Parameterization of the dielectric function of In_xA_l-xAs alloys as a function of composition”

Tae Jung Kim, Jae Chan Park, Nilesh S. Barange, Han Gyeol Park, Yu Ri Kang, Koo Hyun Nam, and Young Dong Kim

Current Applied Physics, Vol. 15, Supplement 2, 1 September 2015, pp. S30~S34

“Pressure dependence of effective dynamic charge in In_xAl_1-xAs ternary alloys”

Ta-Ryeong Park, Young Dong Kim, and Jin Dong Song

Solid State Communications, Vol. 221, 1 November 2015, pp. 41~44

“Theoretical Study for the ITO/Si based High Contrast Grating Structure with Focusing Capability and its Fabrication”

J. Y. Kim, K. H. Yeon, J. Kyhm, W. J. Cho, T. J. Kim, Y. D. Kim, and J. D. Song

Applied Science and Convergence Technology, Vol. 24, No. 6, 1 November 2015, pp. 250~253

“Dielectric function and critical points of AlP determined by spectroscopic ellipsometry”

S. Y. Hwang, T. J. Kim, Y. W. Jung, N. S. Barange, H. G. Park, J. Y. Kim, Y. R. Kang, Y. D. Kim, S. H. Shin, J. D. Song, C.-T. Liang, and Y.-C. Chang

Journal of Alloys and Compounds, Vol. 587, 25 February 2014, pp. 361~364

“Temperature dependent dielectric function and the E₀ critical points of hexagonal GaN from 30 to 690 K”

Tae Jung Kim, Soon Yong Hwang, Jun Seok Byun, Nilesh S. Barange, Han Gyeol Park, and Young Dong Kim

AIP Advances, Vol. 4, Issue 2, 25 February 2014, pp. 027124

“Parameterization of the dielectric functions of InGaSb alloys”

Tae Jung Kim, Jun Seok Byun, Soon Yong Hwang, Han Gyeol Park, Yu Ri Kang, Jae Chan Park, Young Dong Kim, and David E. Aspnes

Current Applied Physics, Vol. 14, Issue 5, 1 May 2014, pp. 768~771

“Parametric modeling of the dielectric functions of InAs_xP_{1 − x} alloy films on InP”

J. S. Byun, T. J. Kim, S. Y. Hwang, Y. R. Kang, J. C. Park, and Y. D. Kim

Thin Solid Films, Vol. 558, 2 May 2014, pp.438~442

“MgF₂ Monoplate 보정기를 사용한 회전보정기형 타원편광분석기의 제작 및 GaAs 연구에 대한 응용”

최준호, Nilesh S. Barange, Mangesh S. Diware, 김태중, 박재찬, 김영동

새물리 (New Physics: Sae Mulli), Vol. 64, No. 4, 30 April 2014, pp. 371~375

“Effect of Post-annealing Temperature on the Dielectric Function of Solution-processed LaAlO_x/Si Films”

Tae Jung Kim, Jae Chan Park, Soon Yong Hwang, Jun Seok Byun, Han Gyeol Park, Yu Ri Kang, Young Dong Kim, Soo Min Hwang, Seung Muk Lee, and Jinho Joo

Journal of the Korean Physical Society, Vol. 64, No. 10, 1 May 2014, pp. 1509~1513

“Influences of rapid thermal process on solution-deposited Ti-silicate/Si films: Phase segregation, composition and interface changes, and dielectric properties”

Seung Muk Lee, Soo Min Hwang, Soon Yong Hwang, Tae Woong Kim, Sang Hyub Lee, Geun Chul Park, Ju Yun Choi, Jae Jin Yoon, Tae Jung Kim, Young Dong Kim, Hyoungsub Kim, Jun Hyung Lim, and Jinho Joo

Materials Chemistry and Physics, Vol. 145, Issues 1-2, 15 May 2014, pp. 168~175

“Analytic Determination of the Dielectric Function of InSb at Energies from 0.74 to 6.42 eV at Temperatures from 31 to 675 K”

Tae Jung Kim, Jun Seok Byun, Junho Choi, Han Gyeol Park, Yu Ri Kang, Jae Chan Park, and Young Dong Kim

Journal of the Korean Physical Society, Vol. 64, No. 12, 1 June 2014, pp. 1872~1877

“Reinforcement of Interfacial Adhesion of a Coated Polymer Layer on a Cobalt−Chromium Surface for Drug-Eluting Stents”

Tarek M. Bedair, Youngjin Cho, Tae Jung Kim, Young Dong Kim, Bang Ju Park, Yoon Ki Joung, and Dong Keun Han

Langmuir, Vol. 30, No. 27, 23 June 2014, pp. 8020~8028

“Three-Dimensional Analysis of the Collapse of a Fatty Acid at Various Compression Rates using In Situ Imaging Ellipsometry”

Soon Yong Hwang, Tae Jung Kim, Jun Seok Byun, Han Gyeol Park, Junho Choi, Yu Ri Kang, Jae Chan Park, and Young Dong Kim

Journal of the Optical Society of Korea, Vol. 18, No. 4, 25 August 2014, pp. 350~358

“Parametrization of the Optical Constants of AlAs_xSb_1-x Alloys in the Range 0.74-6.0 eV”

Tae Jung Kim, Jun Seok Byun, Nilesh Barange, Han Gyeol Park, Yu Ri Kang, Jae Chan Park, and Young Dong Kim

Journal of the Optical Society of Korea, Vol. 18, No. 4, 25 August 2014, pp. 359~364

“Ellipsometric Study of the Temperature Dependences of the Dielectric Function and the Critical Points of AlSb at Temperatures from 300 to 803 K”

Han Gyeol Park, Tae Jung Kim, Soon Yong Hwang, Jun Young Kim, Junho Choi, Young Dong Kim, Sang Hoon Shin, and Jin Dong Song

Journal of the Korean Physical Society, Vol. 65, No. 4, 1 September 2014, pp. 515~519

“Dielectric functions and interband transitions of In_xAl_1-xP alloys”

T. J. Kim, S. Y. Hwang, J. S. Byun, D. E. Aspnes, E. H. Lee, J. D. Song, C.-T. Liang, Y.-C. Chang, H. G. Park, J. Choi, J. Y. Kim, Y. R. Kang, J. C. Park, and Y. D. Kim

Current Applied Physics, Vol. 14, Issue 9, 1 September 2014, pp. 1273~1276

“Analytic Representation of the Dielectric Function of GaN for Temperatures from 26 to 690 K”

Tae Jung Kim, Jun Seok Byun, Junho Choi, Han Gyeol Park, Yu Ri Kang, Jae Chan Park, and Young Dong Kim

Journal of the Korean Physical Society, Vol. 65, No. 5, 1 September 2014, pp.733~738

“푸리에 방법을 결합한 타원편광분석법 전이점 연구”

박한결, 김태중, 변준석, 강유리, 김영동

새물리, Vol. 64, No. 10, 1 October 2014, pp. 963~967

“Temperature dependent band-gap energy for Cu₂ZnSnSe₄: A spectroscopic ellipsometric study”

S. G. Choi, T. J. Kim, S. Y. Hwang, J. Li, C. Persson, Y. D. Kim, S.–H. Wei, and I. L. Repins

Solar Energy Materials and Solar Cells, Vol.130, 1 November 2014, pp. 375~379

“Blue Inorganic Light Emitting Diode on Flexible Polyimide Substrate Using Laser Lift-Off Process”

Nilesh Barange, Young Dong Kim, Hyungduk Ko, Joon-Suh Park, Byoungnam Park, Doo-Hyun Ko, and Il Ki Han

Journal of Nanoscience and Nanotechnology, Vol. 14, No. 11, 1 November 2014, pp. 8237~8241

“Dielectric Functions of Solution-Processed GdAlO_x/Si Films Measured with Vacuum Ultra-Violet Spectroscopic Ellipsometry”

Tae Jung Kim, Han Gyeol Park, Sang Hyub Lee, Soo Min Hwang, Soon Yong Hwang, Jun Young Kim, Junho Choi, Yu Ri Kang, Young Dong Kim, and Jinho Joo

Journal of Nanoscience and Nanotechnology, Vol. 14, No. 11, 1 November 2014, pp. 8715~8718

“Stability of UV Exposed RR-P3BT Films by Spectroscopic Ellipsometry”

Mangesh S. Diware, Jun Seok Byun, Soon Yong Hwang, Tae Jung Kim, and Young Dong Kim

American Institute of Physics Conference Proceedings (DAE-SSPS2012), 2 February 2013, Vol. 1512, pp. 658~659

“Interband transitions and dielectric functions of InGaSb alloys”

T. J. Kim, J. J. Yoon, J. S. Byun, S. Y. Hwang, D. E. Aspnes, S. H. Shin, J. D. Song, C.-T. Liang, Y.-C. Chang, N. S. Barange, J. Y. Kim, and Y. D. Kim

Applied Physics Letters, Vol. 102, Issue 10, 14 March 2013, pp.102109-1~4

“Formation of self-assembled large droplet-epitaxial GaAs islands for the application to reduced reflection”

E. H. Lee, J. D. Song, J. J. Yoon, M. H. Bae, I. K. Han, W. J. Choi, S. K. Chang, Y. D. Kim, and J. S. Kim

Journal of Applied Physics, Vol. 113, Issue 15, 16 April 2013, pp. 154308-1~6

“Temperature-dependent optical properties of epitaxial CdO thin films determined by spectroscopic ellipsometry and Raman scattering”

S. G. Choi, L. M. Gedvilas, S. Y. Hwang, T. J. Kim, Y. D. Kim, J. Zuniga-Perez, and V. Munoz Sanjose

Journal of Applied Physics, Vol. 113, Issue 18, 9 May 2013, pp. 183515-1~5

“Temperature and Magnetic Field Effects on Electron Transport Through DNA Molecules in a Two-Dimensional Four-Channel System”

Yong S. Joe, Sun H. Lee, Eric R. Hedin, and Young D. Kim

Journal of Nanoscience and Nanotechnology, Vol. 13, No. 6, 1 June 2013, pp. 3889–3896

“Optical properties of AlAs_xSb_1-x alloys determined by in situ ellipsometry”

J. Y. Kim, J. J. Yoon, T. J. Kim, Y. D. Kim, E. H. Lee, M. H. Bae, J. D. Song, W. J. Choi, C.-T. Liang, and Y.-C. Chang

Applied Physics Letters, Vol. 103, Issue 1, 1 July 2013, pp. 011901-1~4

“Optical properties of solution-processed LaAlO_x/Si films using spectroscopic ellipsometry”

Tae Jung Kim, Soo Min Hwang, Jae Jin Yoon, Soon Yong Hwang, Han Gyeol Park, Jun Young Kim, Junho Choi, Young Dong Kim, Seung Muk Lee, and Jinho Joo

Journal of Vacuum Science and Technology B, Vol. 31, Issue 4, 12 July 2013, pp. 04D110-1~4

“Application of rapid thermal process to solution-processed Ti-silicate films for enhancing permittivity without losing amorphous nature”

Seung Muk Lee, Soo Min Hwang, Soon Yong Hwang, Tae Woong Kim, Ju Yun Choi, Joong Keun Park, Tae Jung Kim, Young Dong Kim, Hyoungsub Kim, Jun Hyung Lim, Jinho Joo

Current Applied Physics, Vol. 13, Supplement 2, 20 July 2013, pp. S41~S44

“Optical properties and photo-oxidative degradation of regioregular poly(3-butylthiophene) films by spectroscopic ellipsometry”

Mangesh S. Diware, Tae Jung Kim, Jun Seok Byun, Soon Yong Hwang, Nilesh S. Barange, Young Dong Kim

Thin Solid Films, Vol. 542, 2 September 2013, pp. 338~342

“Temperature dependence of the dielectric functions and the critical points of InSb by spectroscopic ellipsometry from 31 to 675K”

Tae Jung Kim, Soon Yong Hwang, Jun Seok Byun, Mangesh S. Diware, Junho Choi, Han Gyeol Park, and Young Dong Kim

Journal of Applied Physics, Vol. 114, Issue 10, 10 September 2013, pp. 103501-1~5

“Effect of different sputtering gas mixtures on the structural, electrical, and optical properties of p-type NiO thin films”

Joon-Ho Oh, Soon Yong Hwang, Young Dong Kim, Jun-Hyuk Song, and Tae-Yeon Seong

Materials Science in Semiconductor Processing, Vol. 16, Issue 5, 1 October 2013, pp.1346~1351

“Dielectric functions of In_1−xAl_xSb alloys for arbitrary compositions with parametric modeling”

Mangesh S. Diware, Tae Jung Kim, Jae Jin Yoon, Nilesh S. Barange, Jun Seok Byun, Han Gyeol Park, Young Dong Kim, Sang Hoon Shin, and Jin Dong Song

Thin Solid Films, Vol. 546, 1 November 2013, pp. 26~30

“Effect of incidence angle and polarization on the optimized layer structure of organic solar cells”

Sanghwa Lee, Inkyung Jeong, Hyeong Pil Kim, Soon Yong Hwang, Tae Jung Kim, Young Dong Kim, Jin Jang, and Jungho Kim

Solar Energy Materials & Solar Cells, Vol. 118, November 2013, pp.9~17

“Lattice constants and optical response of pseudomorph Si-rich SiGe:B”

O. Caha, P. Kostelnik, J. Sik, Y. D. Kim, and J. Humlicek

Applied Physics Letters, Vol. 103, Issue 20, 12 November 2013, pp. 202107-1~4

“Analytic representation of the dielectric functions of InAs_xSb_1−x alloys in the parametric model”

S. Y. Hwang, T. J. Kim, J. S. Byun, N. S. Barange, M. S. Diware, Y. D. Kim, D. E. Aspnes, J. J. Yoon, and J. D. Song

Thin Solid Films, Vol. 547, 29 November 2013, pp. 276~279

“Stepwise fluorescence changes of quantum dots: Single-molecule spectroscopic studies on the properties of turn-on quantum dots”

Yea Seul Kim, Min Young Kim, Jae Kyu Song, Tae Jung Kim, Young Dong Kim, and Sang Soo Hah

Chemical Communications, Vol. 48, Issue 5, 18 January 2012, pp. 723~725

“Parametric Modeling of the Dielectric Function and Identification of the Critical Point of a CdMgTe Alloy in the Vacuum Ultraviolet Spectral Range”

Tae Jung Kim, Tae Ho Ghong, Jae Jin Yoon, Soon Yong Hwang, Nilesh Barange, Young Dong Kim, and Yia-Chung Chang

Journal of the Korean Physical Society, Vol. 60, No. 8, 15 April 2012, pp.1219~1223

“Study of the Interaction Between HSA and Oligo-DNA Using Total Internal Reflection Ellipsometry”

Y. W. Jung, J. S. Byun, Y. D. Kim, D. Hemzal, and J. Humlicek

Journal of the Korean Physical Society, Vol. 60, No. 8, 15 April 2012, pp. 1288~1291

“Electromagnetic compatibility of aperture antennas using electromagnetic band gap structure”

J. -F. D. Essiben, E. R. Hedin, Y. D. Kim, and Y. S. Joe

The Institution of Engineering and Technology Microwaves, Antennas Propagation, Vol. 6, Issue 9, 19 June 2012, pp.982~989

“Investigation of the Dielectric Function of Solution-Processed InGaZnO Films Using Ellipsometry”

Tae Jung Kim, Jae Jin Yoon, Soo Min Hwang, Jun Hyuk Choi, Soon Yong Hwang, Tae Ho Ghong, Nilesh Barange, Jun Young Kim, Young Dong Kim, and Jinho Joo

Journal of Nanoscience and Nanotechnology, Vol. 12, No. 7, 1 July 2012 , pp. 5804~5807

“Parameterization of the dielectric function of InP from 1.19 to 6.57 eV for temperatures from 25 to 700 K”

Tae Jung Kim, Soon Yong Hwang, Jun Seok Byun, Mangesh S. Diware, Junho Choi, Han Gyeol Park, and Young Dong Kim

Journal of Applied Physics, Vol. 112, Issue 1, 3 July 2012, pp. 013505-1~6

“Temperature Dependence of the Dielectric Function and Critical-point Energies of InAs”

Tae Jung Kim, Soon Yong Hwang, Jun Seok Byun, Nilesh S. Barange, Jun Young Kim, and Young Dong Kim

Journal of the Korean Physical Society, Vol. 61, No. 1, 15 July 2012, pp. 97~101

“Investigation of InSb Critical-point Energies at 25 K by Using Spectroscopic Ellipsometry”

Tae Jung Kim, Soon Yong Hwang, Junho Choi, Jun Seok Byun, Mangesh S. Diware, Han Gyeol Park, and Young Dong Kim

Journal of the Korean Physical Society, Vol. 61, No. 3, 15 August 2012, pp. 439~443

“Dielectric Function and Energy of the E₀ Critical Point of Hexagonal GaN at 26 K Studied by Using Spectroscopic Ellipsometry”

Tae Jung Kim, Soon Yong Hwang, Junho Choi, Han Gyeol Park, Jun Seok Byun, Nilesh S. Barange, and Young Dong Kim

Journal of the Korean Physical Society, Vol. 61, No. 5, 15 September 2012, pp. 791~794

“Enhancement of charge transport in DNA molecules induced by the next nearest-neighbor effects”

Sadeq Malakooti, Eric R. Hedin, Young Dong Kim, and Yong S. Joe

Journal of Applied Physics, Vol. 112, Issue 9, 6 November 2012, pp. 094703-1~6

“Pressure-induced variation of effective dynamic charge in InP_1-xAs_x alloys due to charge transfer within cation sublattice”

Ta-Ryeong Park, Jun Seok Byun, Tae Jung Kim, and Young Dong Kim

Solid State Communications, Vol. 152, Issue 24, 22 November 2012, pp. 2177~2180

“Pressure-induced Resonance Raman Effect of InAs_xP_1−x Alloy Films on InP”

Jun Seok Byun, Young Dong Kim, and Ta-Ryeong Park

Journal of the Korean Physical Society, Vol. 61, No. 10, 1 November 2012, pp. 1573~1577

“Parametric Model Dielectric Functions of InAs for Temperatures from 22 to 675 K”

Tae Jung Kim, Soon Yong Hwang, Jun Seok Byun, Mangesh S. Diware, Jun Young Kim, and Young Dong Kim

Journal of the Korean Physical Society, Vol. 61, No. 11, 14 December 2012, pp. 1821~1825

“Dielectric function spectra at 40 K and critical-point energies for CuIn_0.7Ga_0.3Se₂”

S. G. Choi, R. Chen, C. Persson, T. J. Kim, S. Y. Hwang, Y. D. Kim, and L. M. Mansfield

Applied Physics Letters, Vol. 101, Issue 26, 26 December 2012, pp. 261903-1~4

“Optical Study of Mn-Doped Bi₄Ti₃O₁₂ Thin Films by Spectroscopic Ellipsometry”

Soon Yong Hwang, Tae Jung Kim, Jae Jin Yoon, Young Hun Cha, Young Dong Kim, Tae-Geun Seong, Lee-Seung Kang, and Sahn Nahm

Journal of Nanoscience and Nanotechnology, Vol. 11, No. 1, January 2011, pp. 884~888

“Effect of annealing temperature on microstructural evolution and electrical properties of sol-gel processed ZrO₂/Si films”

Soo Min Hwang, Seung Muk Lee, Kyung Park, Myung Soo Lee, Jinho Joo, Jun Hyung Lim, Hyoungsub Kim, Jae Jin Yoon, and Young Dong Kim

Applied Physics Letters, Vol. 98, Issue 2, 11 January 2011, pp. 022903

“Analysis of Randomly Spaced Quantum Dots with Oxide Overlayers Using Spectroscopic Ellipsometry”

Jun Seok Byun, Seung Ho Han, Tae Ho Ghong, Young Dong Kim, Jin Mo Chung, and Jin Dong Song

Journal of the Korean Physical Society, Vol. 58, No. 4, 15 April 2011, pp. 943~946

“Study of the Interaction Between Biomolecule Monolayers Using Total Internal Reflection Ellipsometry”

Yong Woo Jung, Jae Jin Yoon, Young Dong Kim, and Deokha Woo

Journal of the Korean Physical Society, Vol. 58, No. 4, 15 April 2011, pp. 1031~1034

“Roughness Analysis of the Critical Dimension by Using Spectroscopic Ellipsometry”

T. H. Ghong, S.-H. Han, J.-M. Chung, J. S. Byun, Y. D. Kim, and D. E. Aspnes

Journal of the Korean Physical Society, Vol. 58, No. 5, 13 May 2011, pp. 1426~1428

“Optical study of sol-gel processed ZrO₂/Si films by spectroscopic ellipsometry”

J. J. Yoon, S. M. Lee, T. J. Kim, S. Y. Hwang, M. Diware, Y. D. Kim, S. M. Hwang, and J. Joo

Journal of Vacuum Science & Technology B, Vol. 29, Issue 4, 8 July 2011, pp. 04D108-1~ 04D108-5

“Investigation of the Crystallization of Amorphous Si by Imaging Ellipsometry”

Tae Jung Kim, Jae Jin Yoon, Yong Woo Jung, Soon Yong Hwang, and Young Dong Kim

Journal of Nanoscience and Nanotechnology, Vol. 11, No. 7, July 2011, pp. 6198~6202

“Analysis of 2D Periodic Nanostructures with an Oxide Overlayer via Spectroscopic Ellipsometry”

T. H. Ghong, J. S. Byun, S.-H. Han, J.-M. Jung, and Y. D. Kim

Journal of Nanoscience and Nanotechnology, Vol. 11, No. 7, July 2011, pp. 6514~6517

“Dielectric response of AlP by in-situ ellipsometry”

Y. W. Jung, J. S. Byun, S. Y. Hwang , Y. D. Kim, S. H. Shin, and J. D. Song

Thin Solid Films, Vol. 519, issue 22, 01 September 2011, pp. 8027~8029

“Effect of the Ga Ratio on the Dielectric Function of Solution-processed InGaZnO Films”

Tae Jung Kim, Jae Jin Yoon, Tae Ho Ghong, Nilesh Barange, Jun Young Kim, Soon Yong Hwang, Young dong Kim, Soo Min Hwang, Jun Hyuk Choi, and Jinho Joo

Journal of the Korean Physical Society, Vol. 59, No. 6, 15 December 2011, pp. 3396~3400

“Temperature dependence of the dielectric response of AlSb”

Y. W. Jung, T. J. Kim, Y. D. Kim, S. H. Shin, S. Y. Kim, and J. D. Song

American Institute of Physics Conference Proceedings (ICPS2010), Vol. 1399, 23 December 2011, pp. 37~38

“Analysis of surface roughness of critical-dimension structures using spectroscopic ellipsometry”

T. H. Ghong, S.-H. Han, J.-M. Chung, J. S. Byun, D. E. Aspnes, and Y. D. Kim

American Institute of Physics Conference Proceedings (ICPS2010), Vol. 1399, 23 December 2011, pp. 533~534

“Optical metrology of randomly-distributed Au colloids on a multilayer film”

Shih-Hsin Hsu, Yia-Chung Chang, Yi-Chun Chen, Pei-Kuen Wei, and Y. D. Kim

Optics Express, Vol. 18, No. 2, 18 January 2010, pp.1310~1315

“Nondestructive analysis of coated periodic nanostructures from optical data”

T. H. Ghong, S.-H. Han, J.-M. Chung, J. S. Byun, T. J. Kim, D. E. Aspnes, Y. D. Kim, I. H. Park, and Y.-W. Kim

Optics Letters, Vol. 35, No. 5, 1 March 2010, pp.733~735

“Ellipsometric study on the optical property of UV exposed MEH-PPV polymer film”

Y. W. Jung, J. S. Byun, Y. H. Cha, and Y. D. Kim

Synthetic Metals, Vol. 160, Issue 7-8, 01 April 2010, pp. 651~654

“Study on an Asymmetric Nanostructure by Using a Rigorous Coupled-wave Analysis”

Tae Jung Kim, Seung-Ho Han, Tae Ho Ghong, Jun Seok Byun, Jin-Mo Chung, and Young Dong Kim

Journal of the Korean Physical Society, Vol. 56, No. 4, 15 April 2010, pp. 1278~1281

“Optical properties of bismuth niobate thin films studied by spectroscopic ellipsometry”

Y. J. Kang, T. H. Ghong, Y. W. Jung, J. S. Byun, S. Kim, Y. D. Kim, T.-G. Seong, K.-H. Cho, and S. Nahm

Thin Solid films, Vol. 518, Issue 22, 1 September 2010, pp. 6526~6530

“Dielectric functions and interband transitions of In_1−xAl_xSb alloys”

J. J. Yoon, T. J. Kim, Y. W. Jung, D. E. Aspnes, Y. D. Kim, H. J. Kim, Y. C. Chang, S. H. Shin, and J. D. Song

Applied Physics Letters, Vol. 97, Issue 11, 13 September 2010, pp. 111902

“InAs critical-point energies at 22 K from spectroscopic ellipsometry”

Tae Jung Kim, Jae Jin Yoon, Soon Yong Hwang, Yong Woo Jung, Tae Ho Ghong, Young Dong Kim, HyeJung Kim, and Yia-Chung Chang

Applied Physics Letters, Vol. 97, Issue 17, 29 October 2010, pp. 171912

“Temperature-dependent Dielectric Functions of InP between 25 K and 700 K”

T. J. Kim, J. J. Yoon, Y. H. Cha, S. Kim, and Y. D. Kim

Journal of the Korean Physical Society, Vol. 57, No. 6, 15 December 2010, pp. 1960~1964

“In-situ study of molecular dynamics in a water environment by using imaging ellipsometry”

Soon Yong Hwang, Tae Jung Kim, Mangesh S Diware, and Young Dong Kim

Advances in Natural Sciences: Nanoscience and Nanotechnology, Vol. 1, No. 4, 22 December 2010, pp. 045003

“Vacuum Ultra Violet Spectroscopic Ellipsometry 를 이용한 BaSm₂Ti₄O₁₂ 의 광 특성 연구”

황순용, 윤재진, 정용우, 변준석, 김영동, 정영훈, 남산

한국진공학회지, 제18권, 1호, 01 January 2009, pp.60~65

“Ellipsometric analysis of porous anodized aluminum oxide films”

Y. W. Jung , J. S. Byun , D. H. Woo, and Y. D. Kim

Thin Solid Films, Vol. 517, 10 January 2009, pp. 3726~3730

“Optical characterization of BaSm₂Ti₄O₁₂ thin films by spectroscopic ellipsometry”

J. J. Yoon , S. Y. Hwang , Y. J. Kang , Y. D. Kim, Y. H. Jeong, and S. Nahm

Thin Solid Films, Vol. 517, 03 February 2009, pp. 3923~3926

“Dielectric response of AlSb from 0.7 to 5.0 eV determined by in situ ellipsometry”

Y. W. Jung, T. H. Ghong, J. S. Byun, Y. D. Kim, H. J. Kim, Y. C. Chang,

S. H. Shin, and J. D. Song

Applied Physics Letters, Vol. 94, No. 23, 12 June 2009, pp. 231913

“Imaging of Collapsed Fatty Acid Films at Air-Water Interfaces”

Sangjun Seok, Tae Jung Kim, Soon Yong Hwang, Young Dong Kim, David Vaknin, and

Doseok Kim

Langmuir, Vol. 25, No. 16, 18 August 2009, pp. 9262~9269

“Interband transitions of InAs_xSb_1−x alloy films”

T. J. Kim, J. J. Yoon, S. Y. Hwang, D. E. Aspnes, Y. D. Kim, H. J. Kim, Y. C. Chang, and J. D. Song

Applied Physics Letters, Vol. 95, No. 11, 14 September 2009, pp. 111902

“Optical Properties of InP at a Higher Bandgap Region Studied at 25 K and 300 K by Using Ellipsometry”

T. J. Kim, J. J. Yoon, T. H. Ghong, and Y. D. Kim

Journal of the Korean Physical Society, Vol. 55, No. 3, 15 September 2009, pp. 1136~1139

“Interference effect on Raman spectrum of graphene on SiO₂ / Si”

Duhee Yoon, Hyerim Moon, Young-Woo Son, Jin Sik Choi, Bae Ho Park, Young Hun Cha, Young Dong Kim, and Hyeonsik Cheong

Physical review B, Vol. 80, 23 September 2009, pp. 125422

“Observation of new critical point in In_xAl_1-xAs alloy using spectroscopic Ellipsometry”

J. J. Yoon, T. H. Ghong, J. S. Byun, Y. J. Kang, Y. D. Kim, H. J. Kim, Y. C. Chang , J. D. Song

Applied Surface Science, Vol. 256, No. 4, 30 November 2009, pp. 1031~1034

“Study on Interface Analysis by Using Spectroscopic Ellipsometry”

T. J. Kim, T. H. Ghong, Y. W. Jung, J. J. Yoon, and Y. D. Kim

Journal of the Korean Physical Society, Vol. 55, No. 6, 15 December 2009, pp. 2625~2629

“Dielectric Function and Band-Gap Study of ZnSe Film”

T. H. Ghong, T. J. Kim, J. J. Yoon, and Y. D. Kim

Journal of the Korean Physical Society, Vol. 52, February 2008, pp. S84~S87

“Vacuum UV spectroscopic ellipsometry study on Ga_1-xCr_xN (0≤x≤0.1) alloy films”

T. H. Ghong, T. J. Kim, S. Y. Lee, Y. D. Kim, J. J. Kim, H. Makino, and T. Yao

Microelectronics Journal, Vol 39, March 2008, pp. 541~543

“Dielectric function analysis of ZnSe and CdSe using parametric semiconductor model”

Y. W. Jung, J. J. Yoon, J. S. Byun, and Y. D. Kim

Microelectronics Journal, Vol 39, March 2008, pp. 570~572

“Characterization of Si nanorods by spectroscopic ellipsometry with efficient theoretical modeling”

Shih-Hsin Hsu, En-Shao Liu, Yia-Chung Chang, James N. Hilfiker, Young Dong Kim, Tae Jung Kim, Chun-Jung Lin, and Gong-Ru Lin

Physica Status Solidi (a), Vol. 205, No. 4, March 2008, pp.876~879

“Optical nanometrology of Au nanoparticles on a multilayer film”

Yia-Chung Chang, Shih-Hsin Hsu, Pei-Kuen Wei, and Young Dong Kim

Physica Status Solidi (c), Vol. 5, No. 5, March 2008, pp. 1194~1197

“Dielectric properties of InAsP alloy thin films and evaluation of direct- and reciprocal-space methods of determining critical-point parameters”

S. G. Choi, D. E. Aspnes, N. A. Stoute, Y. D. Kim, H. J. Kim, Y.-C. Chang, and C. J. Palmstrøm

Physica Status Solidi (a), Vol. 205, No. 4, April 2008, pp.884~887

“Overlayer effects in the critical-point analysis of ellipsometric spectra: Application to In_xGa_1−xAs alloys”

T. H. Ghong, T. J. Kim, Y. W. Jung, Y. D. Kim, and D. E. Aspnes

Journal of Applied Physics, Vol.103, No 7, April 2008, pp. 073502

“Optical properties of In_xAl_1−xAs alloy films”

J. J. Yoon, T. H. Ghong, J. S. Byun, Y. D. Kim, D. E. Aspnes, H. J. Kim, Y. C. Chang,

and J. D. Song

Applied Physics Letters, Vol. 92, No.15, April 2008, pp. 151907

“Model dielectric functions for Al_xGa_1−xAs alloys of arbitrary compositions”

Y. W. Jung, T. J. Kim, J. J. Yoon, Y. D. Kim, and D. E. Aspnes

Journal of Applied Physics, Vol. 104, No. 1, 9 July 2008, pp. 013515

“Multilayer Calculation on SR Signal during Growth of ZnO Nanorod”

J. S. Byun, J. J. Yoon, Y. D. Kim, E. Ahn, E. Yoon, S. J. An, and G. –C. Yi

Journal of the Korean Physical Society, Vol. 53, No. 1, July 2008, pp. 388~391

“Dielectric Function Study on Zincblende CdSe Film”

T. H. Ghong, Y. W. Jung, J. J. Yoon, Y. D. Kim, H. J. Kim, and Y. C. Chang

Journal of the Korean Physical Society, Vol. 53, No. 1, July 2008, pp. 367~370

“Optical Properties of GaN by Using Ellipsometry and a Band Calculation”

Tae Jung Kim, Jun Seok Byun, Young Dong Kim, Yia-Chung Chang, and HyeJung Kim

Journal of the Korean Physical Society, Vol. 53, No. 3, September 2008, pp. 1575~1579

“Optical Properties of BaSm₂Ti₄O₁₂ Thin Films Studied by Using Spectroscopic Ellipsometry”

J. J. Yoon, Y. W. Jung, S. Y. Hwang, Y. D. Kim, S. Nahm, and Y. H. Jeong

Journal of the Korean Physical Society, Vol. 53, No. 3, September 2008, pp. 1352~1356

“Spectroscopic Ellipsometric Analysis of a Si Grating Pattern Made by Photolithograph”

S.-H. Han, T. H. Ghong, J.-M. Chung, Y. D. Kim, Y. Y. Yu, and K. C. Park

Journal of the Korean Physical Society, Vol. 53, No. 3, September 2008, pp. 1520~1524

“Direct Imaging of a Collapsed Langmuir Monolayer and Multilayer Formation”

Sangjun Seok, Doseok Kim, Tae Jung Kim, Young Dong Kim, and David Vaknin

Journal of the Korean Physical Society, Vol. 53, No. 3, September 2008, pp. 1488~1491

“Analysis on the Grating Structure of Si by Using Spectroscopic Elipsometry”

S.-H. Han, T. H. Ghong, J. S. Byun, Y. D. Kim, Y. Y. Yu, and K. C. Park

Journal of the Korean Physical Society, Vol. 53, No. 4, October 2008, pp. 2324~2327

“Study of Defects on Zn_0.95Mn_0.05O by Using Deep Level Transient Spectroscopy”

Jae-Hoon Kim, Hoo young Song, Eun Kyu Kim, Young Dong Kim, and Hong Chu

Journal of the Korean Physical Society, Vol. 53, No. 5, November 2008, pp. 2374~2377

“Real-time monitoring of InAs QD growth procedure on InP substrate by spectral reflectance”

E. Ahn , K. Parka, B. Kim , Y.D. Kim, and E. Yoon

Applied Surface Science, Vol. 255, November 2008, pp. 656~658

“Application of spectral reflectance to the monitoring of ZnO nanorod growth”

T. H. Ghong , Y. D. Kim , E. Ahn , E. Yoon , S. J. An, and G.-C. Yi

Applied Surface Science, Vol. 255, November 2008, pp. 746~748

“Analysis of interface layers by spectroscopic ellipsometry”

T. J. Kim, J. J. Yoon, Y. D. Kim , D. E. Aspnes, M. V. Klein, D.-S. Ko, Y.-W. Kim, V. C. Elarde, and J. J. Coleman

Applied Surface Science, Vol. 255, November 2008, pp. 640~642

“Modeling of the Dielectric Functions of Zn_xCd_1-xSe Alloys”

J. J. Yoon, T. J. Kim, and Y. D. Kim

Journal of the Korean Physical Society, Vol. 53, No. 6, December 2008, pp. 3690~3693

“In situ monitoring of the growth procedure of InAs layer by spectral reflectance”

Eungjin Ahn, Young Soo Lee, Jungsub Kim, Young Dong Kim, and Euijoon Yoon

Journal of Crystal Growth, Vol. 298, January, 2007, pp. 50~53

“변수화 반도체 모델을 이용한 Cubic Zinc-Blende CdSe의 유전함수 분석”

정용우, 공태호, 이선영, 김영동

한국진공학회지, Vol. 16, January 2007, pp. 40~45

“Dielectric Functions of CdSe and ZnSe Obtained by Using Vacuum Ultra-Violet Spectroscopic Ellipsometry”

T. J. Kim, S. Y. Lee, A. J. Choi, and Y. D. Kim

Journal of Korean Physical Society, Vol. 50, No. 3, March 2007, pp. 806~809

“Electrical properties of the Sm₂Ti₂O₇ thin films for metal-insulator-metal capacitor applications”

Y. H. Jeong, J. C. Kim, J. B. Lim, K. P. Hong, S. Nahm, H. J. Sun, T. H. Ghong, Y. D. Kim, and H. J. Lee

Journal of Applied Physics, Vol. 101, No 8, April 2007, pp. 084108

“Spectroscopic Ellipsometric Analysis of a Patterned Cr Film on Quartz”

S. Y. Lee, T. H. Ghong, J. –M. Chung, Y. D. Kim, D. S. Kim, and C. H. Kim

Journal of the Korean Physical Society, Vol. 51, No. 1, July 2007, pp. 189~192

“Dielectric functions and electronic structure of InAs_xP_1−x films on InP”

S. G. Choi, C. J. Palmstrøm, Y. D. Kim, D. E. Aspnes, H. J. Kim, and Yia-Chung Chang

Applied Physics Letters, Vol. 91, No. 4, July 2007, pp. 041917

“High-Capacitance Metal-Insulator-Metal Capacitors Using Amorphous Sm₂Ti₂O₇ Thin Film”

J. C. Kim, Y. H. Jeong, J. B. Lim, K. P. Hong, S. Nahm, T. H. Ghong, and Y. D. Kim

Journal of The Electrochemical Society, Vol. 154, No. 10, August 2007, pp. G220~G223

“3D Nano Object Recognition based on Phase Measurement Technique”

Daesuk Kim, Byung Joon Baek, Young Dong Kim, and Bahram Tavidi

Journal of the Optical Society of Korea, Vol.11, No.3, September 2007, pp. 108 ~ 112

“Effect of overlayers on critical-point parameters in the analysis of ellipsometric spectra”

Y. W. Jung, T. H. Ghong, Y. D. Kim, and D. E. Aspnes

Applied Physics Letters, Vol. 91, No.12, September 2007, pp. 121903

“Investigation of effective-medium approximation, alloy, average-composition, and graded-composition models for interface analysis by spectroscopic ellipsometry”

T. J. Kim, T. H. Ghong, Y. D. Kim, D. E. Aspnes, M. V. Klein, D-S. Ko and Y-W. Kim, V. C. Elarde, and J. J. Coleman

Journal of Applied Physics, Vol. 102, No.6, September 2007, pp. 063512

“Fourier 변환을 이용한 ZnCdSe 전이점 연구”

윤재진, 공태호, 김영동

한국진공학회지, Vol. 16, No. 6, November 2007, pp. 458~462

“Optical properties of Co silicides : Experiment and density functional theory”

Y. V. Kudryavtsev, V. A. Oksenenko, Y. P. Lee, J. Y. Rhee, and Y. D. Kim

Journal of Applied Physics, Vol. 102, November 2007, pp. 103~503

“Electron transmission through coupled quantum dots in an Aharonov-Bohm ring”

Y. S. Joe and Y. D. Kim

Journal of Korean Physical Society, Vol. 48, June 2006, pp. 1360~1364

“Interface analysis of an AlGaAs multilayer system by using spectroscopic Ellipsometry”

T. H. Ghong, Y. D. Kim, D. E. Aspnes, M. V. Klein, D. S. Ko, Y. W. Kim, V. Elarde, and J. Coleman

Journal of Korean Physical Society, Vol. 48, June 2006, pp. 1601~1605

“Study on crystallization of a-Si measured by imaging spectroscopic Ellipsometry”

A. J. Choi, T. J. Kim, Y. D. Kim, J. H. Oh, and J. Jang

Journal of Korean Physical Society, Vol. 48, June 2006, pp. 1544~1547

“Study on the dielectric function of the CdMgTe alloy by using vacuum ultraviolet spectroscopic ellipsometry”

T. J. Kim, Y. D. Kim, and J. Kossut

Journal of Korean Physical Society, Vol. 49, September 2006, pp. 1156~1159

“Observation of a wavelength-dependent shift of the extinction angle of polarizers in spectroscopic Ellipsometry”

S. Y. Lee, Y. W. Jung, and Y. D. Kim

Journal of Korean Physical Society, Vol. 49, September 2006, pp. 1217~1220

“In-Situ monitoring of InAs/GaAs QDs by using spectral reflectance”

E. Ahn, Y. S. Lee, J. Kim, E. Yoon, and Y. D. Kim

Journal of Korean Physical Society, Vol. 49, September 2006, pp. 947~950

“Imaging ellipsomtery study on the Ni-mediated crystallization of a-Si”

A. J. Choi, T. H. Ghong, Y. D. Kim, J. H. Oh, and J. Jang

Journal of Applied Physics, Vol. 100, No. 11, September 2006, pp. 113529

“Ellipsometric analysis on interface effects in CdMgTe and AlGaAS multilayer systems”

T. J. Kim, T. H. Ghong, Y. S. Ihn, and Y. D. Kim

Journal of Korean Physical Society, Vol. 46, June 2005, pp. S171~S174

“Optical properties of (GaSb)_3n(AlSb)_n (1≤n≤5) superlattices

S. G. Choi, S. K. Srivastava, and C. J. Palmstrom, Y. D. Kim, S. L. Cooper, and D. E. Aspnes

Journal of Vacuum Science Technology B, Vol. 23, No. 3, June 2005, pp. 1149~1153

“Dielectric functions of Al_xGa_1-xSb (0.00≤x≤0.39) alloys from 1.5 to 6.0 eV”

S. G. Choi, C. J. Palmstrom, Y. D. Kim, S. L. Cooper, and D. E. Aspnes

Journal of Applied Physics, Vol. 98, November 2005, pp. 104108

“주기 구조물의 비파괴 검사 방법”

김영동, 한승호, 정진모

국내 특허 출원 제 10-2007-0052806 호, 2007 년 05 월 30 일

“그린함수 방법을 이용한 주기 구조물의 비파괴검사 방법”

김영동, 한승호, 정진모

국내 특허 출원 제 10-2007-0077351 호, 2007 년 08 월 01 일

“METHOD FOR DETERMINING PHYSICAL PROPERTIES OF A MULTILAYERED PERIODIC STRUCTURE”

김영동, 정진모, 한승호

대만 특허 출원 97111443 , 2008 년 03 월26 일

“METHOD FOR DETERMINIMG PHYSICAL PROPERTIES OF A MULTILAYERED PERIODIC STRUCTURE”

김영동, 정진모, 한승호

미국 특허 출원 12/070,717, 2008 년 12월 04 일

“그린 함수 방법을 이용한 주기 구조물 분석 방법”

김영동, 한승호, 정진모

국내 특허 출원 제 10-2009-0070308 호, 2009 년 07 월 30 일

“투명 전극 적층 구조 및 이를 포함하는 표시 장치, 터치 스크린 및 박막 태양 전지”

김영동, 박규창

국내 특허 출원 제 10-2009-0089970 호, 2009 년 09 월 23 일

“주기 구조물의 비파괴 검사 방법”

김영동, 정진모, 한승호

국내 특허 출원 제 10-2010-0009735 호, 2010 년 02 월 02 일

“NONDESTRUCTIVE ANALYSIS FOR PERIODIC STRUCTURE”

김영동, 정진모, 한승호

대만 특허 출원 99108585, 2010 년03 월 23 일

“NONDESTRUCTIVE ANALYSIS FOR PERIODIC STRUCTURE”

김영동, 정진모, 한승호

유럽 특허 출원 10 158 886.1, 2010 년 03 월 31 일

“NONDESTRUCTIVE ANALYSIS FOR PERIODIC STRUCTURE”

김영동, 정진모, 한승호

중국 특허 출원 201010158813.5, 2010 년 04 월 23 일

“NONDESTRUCTIVE ANALYSIS FOR PERIODIC STRUCTURE”

김영동, 정진모, 한승호

일본 특허 출원 2010-151482, 2010 년 07 월 01 일

“NONDESTRUCTIVE ANALYSIS FOR PERIODIC STRUCTURE”

김영동, 정진모, 한승호

미국 특허 출원 12/756,980, 2011 년 02 월 03 일