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We are Nano Optical Properties Laboratory group in Kyung Hee University, Seoul Campus. Our group explores optical properties of materials using Spectroscopic Ellispometry. Our researches focus on
Dielectric functions of emerging 2D materials including MoS2, MoSe2, WS2, WSe2 and their heterostructure
Dielectric functions of anisotropic materials including SnS, SnSe, GaTe, and their alloys
The dependence of temperature on optical properties of the mentioned materials
Linear and non-liner noise filtering using Gaussian Hermite and maximum entropy methods
Briefly, Spectroscopic Ellipsometry measures the change in polarization state of light reflected from the surface of a sample. The measured values are expressed as psi and delta. These values are related to the ratio of Fresnel reflection coefficients, Rp and Rs for p- and s- polarized light, respectively. Because ellipsometry measures the ratio of two values, it can be highly accurate and very reproducible. The ratio is a complex number, thus it contains “phase information, delta, which makes the measurement very sensitive.
For more information in details, please refer our RESEARCH
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