FEI Tecnai G2 20

HT: 200 kV

Magnification: 1.05 MX

Point resolution: 0.19 nm

Line resolution: 0.144 nm

STEM resolution, BF/DF/HAADF: 1 nm

EDS: B onwards

FEI Quanta 200F

Astigmatism, at 30 kV: <25 micron

                     at 1 kV: <50 micron

Magnification: 300 kX

Hi-Vac, SE Detector: Resolution <= 1.2nm WD - 5 nm

Low-Vac, LFD Detector: Resolution <= 3nm WD - 5 nm

Low Vacuum and ESEM mode

Back Scattered electron detector

EDS: B onwards

EBSD: 10 nm step size, grain size ~ 20 nm

Panalytical Empyrean 

Rigaku MiniFlex 600

METCO BAINCUT-HSS

NETZSCH DSC 404 F3 Pegasus

Anton Paar Microindentation Tester: MHT3