2025
[J3] Out-of-Distribution Detection for Semiconductor Wafer Map Defect using GAN and Outlier-Exposure (Link)
Minju Kim, Jaehyeop Hong, Youngbum Hur
Journal of Korean Society for Quality Management
[J2] Deep learning based steel plate surface defect detection with Precise RoI Pooling (Link)
Hyojin Jung, Wonhee Lee, Youngbum Hur
Journal of Korean Society for Quality Management
[J1] Pixel-level Anomaly Detection System for Casting Process Using an Unsupervised Deep Learning Model (Link)
Hyeongmuk Lim, Jinhyuk Suh, Youngbum Hur
Journal of Korean Institute of Industrial Engineers