𝞪-Ag2S is an unusual semiconductor which has excellent ductility at room temperature, which makes it possible to fabricate devices from metallurgical processes via plastic deformation. Under current REU program, the student will use X-ray diffraction, including synchrotron diffraction to study the impacts of plastic deformation on the semiconductor’s structural features: its crystallinity, texturing, densities of point defects. The student will be trained on melt-grown sample synthesis, X-ray fundamentals and operation, as well as data analysis. Moreover, this project provides an opportunity to learn knowledge on crystal lattice, via diffraction study, in the context of semiconductor properties.