Nanotech Analytical Services and Training Corporation (NASAT) Labs offer failure analysis, material characterization, water and environmental testing, and technical training for semiconductors, electronics, and other industries. In addition, they also provide consultation services, immersion programs, research collaborations, and educational tours. The Professional Regulation Commission (PRC) accredited NASAT Labs as a training institution for chemical engineers and chemists.
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The first topic discussed is nanotechnology. Technology paradigms were shown, proving nanotechnology will be the trend in the future. Also, industries incorporating nanotechnology were enumerated. In particular, electronics and semiconductors were said to be embracing it long before it became a trend in other sectors such as pharmaceuticals and materials. By 2024, the global nanotechnology market was forecasted to exceed 125 billion US dollars with electronics, energy, biomedical, cosmetics, defense, automotive, and architecture.
Nanotechnology is defined as the manipulation of matter dimension-sized from 1 to 100 nanometers. An example provided in the discussion is a solution with different sizes of CdSe added. There were significant color differences in each solution showing how dimension affects properties. Nanotechnology applications were presented through products such as Boysen's KNoxOut paint containing nano-titanium dioxide capable of air cleaning, especially nitrous oxide and nitric oxide. The potential of nanotechnology as nano-fertilizers was explored as universities like Central Luzon University and the University of the Philippines - Los Baños already made their versions of nano-fertilizers because of their ability to improve crop yield.
In the second section, different types of microscopes were first introduced (a) optical, (b) acoustic, (c) X-ray, and (d) electrons and their operating principle. Optical microscopes use ordinary light. The switch will enable light to pass through the mirrors and objective lenses. Light will hit the sample, and the reflection will go to the eyepiece equipped with a camera.
Acoustic Microscopes
Acoustic Microscopes
On the contrary, acoustic microscopes use sound waves with MHz frequency (ultrasonic) that gives a better resolution than radio frequency, but it can only be propagated on liquids. Another type of microscope is called an X-ray. It travels through the air but cannot penetrate low-density materials, making it an excellent imaging device for high-density materials. Electron microscopes effectively image nanomaterials because electrons have much smaller wavelengths that can identify tiny particles.
Scanning Electron Microscopy
Scanning Electron Microscopy
The operating principle of Scanning Electron Microscopy (SEM) was thoroughly explained. It starts by generating electrons through a metal filament like tungsten. When tungsten gets heated by a high accelerating voltage, it will create more electrons to be controlled by electromagnetic lenses. The function of these lenses is the generation of electrical fields that control the electron. When these electrons are scanned on the sample's surface, they will produce signals to be collected by the detectors attached to SEM. The computers will process these signals to generate an image for elemental analysis.
Atomic Force Microscopy
Atomic Force Microscopy
The third tool discussed is the Atomic Force Microscopy (AFM). It is a valuable and popular technique for nanotechnology which uses a cantilever with probe tips scanned over the sample surface to create a topographic image of the sample. Several AFM modes for topography include contact AFM. The probe can image the samples through contact with the cantilever, while Dynamic Force Microscopy (DFM) is another mode in AFM that does not allow the probe to contact the surface. It only uses vibration to reach the surface of the sample, and the frequency of the cantilever will change. That change will transform into an image. Some images captured through AFM were also presented.
A core analytical technique, thermal analysis including principles, measurements, and applications, was tackled. Examples of applications of thermal analysis on polymers, rubbers, or chemicals include melting, the degree of crystallinity, material strength/modulus, etc. Typical thermal analysis techniques were also enumerated in the discussion, and these are:
Differential Thermal Analysis (DTA),
Differential Scanning Calorimetry (DSC),
Thermogravimetry (TG),
Thermo Mechanical Analysis (TMA), and
Dynamic Mechanical Analysis (DMA).
The Scope of the Inside
The Scope of the Inside
The virtual laboratory tour, which begins with their Failure Analysis and Material Characterization Division in Muntinlupa, is the event's highlight. Engr. John, the Failure Analysis Engineer at NASAT Labs, gave the tour. The first piece of equipment shown is the Infrared Optimal Beam Induced Resistance Change (IROBIRCH), a semiconductor filler analyzer that uses laser stimulation to discover and evaluate fault locations in the sample. Another characterization of equipment given by Engr. John is a Hitachi SEM with a magnification of 300,000 and a top section made of Energy Dispersive X-ray (EDX). The SEM also includes an ion spotting instrument called the Hitachi Ion Spotter Machine, which is meant to transfer a thin metal layer such as Platinum or Gold over the sample's surface to make it electrically conductive.
Engr. John described the scanning Probe Microscopy (SPM) technique, which employs a physical probe to gather sample surface observations and qualities such as surface roughness, frictional force, magnetic force, viscoelasticity, and others. SPM has several operational modes, the most prevalent of which are Atomic Force Microscopy (AFM) and Dynamic Force Mode (DFM). AFM is a method for detecting atomic forces between a probe and a sample. This indicates that the AFM probe linked to the machine comes into contact with the sample surface, which is referred to as mode. Meanwhile, the DFM method for non-contact mode detects surface roughness using a vibrating cantilever while regulating the probe's distance and the sample surface.
On the other hand, at NASAT Labs' Cabuyao Laguna Testing Facility, led by Engr. Cherry Ann, a Failure Analysis Engineer at the facility, the Ribo Scientific X-ray Fluorescence Analyzer (XRF) was demonstrated, which is a piece of qualitative analytical equipment used to determine the elemental compositions of a sample. Restriction to Hazardous Substances (RHS), a set of criteria developed by the European Union (EU) to limit the use of harmful elements in electrical and electronic devices, systems, and toys, is installed on this equipment.
NASAT Labs also has a Transmission Electron Microscope (TEM) for failure analysis of semiconductor components equipped with thermal cameras to detect heat signatures from semiconductor devices. In addition, Sample Preparation Equipment at Cabuyao Testing Facility was also presented by Engr. Cherry Ann. The following pieces of equipment are:
Ion Milling Machine - NASAT Labs has two Ion Milling Machines (Ion4000Plus & Ion5000). This type of equipment utilizes an ion beam to prepare samples for characterization and produces mirror-like finish touches.
Simultaneous Thermal Analyzer (STA) - STA 200RV from Hitachi provides real-time measurement of sample weight and heat flow. This equipment provides reliable results and simple data analysis. It is equipped with two different parts:
Differential Sample Calorimetry (DSC) monitors sample phase changes as temperature increases. With DSC, melting, crystallization behavior, glass composition temperature, and heat capacities can be analyzed.
Thermo Gravimetric Analysis (TGA) monitors sample weight changes as temperature increases. With TGA, it can perform compositional analysis and thermal stability.
For their Water and Environmental Testing Division led by Ms. Aica, the Laboratory Chemist in NASAT Labs at Cabuyao, Laguna. The General Chemistry Laboratory was presented as well as the equipment used for physical and chemical analysis such as:
UV VIS Spectrophotometer (UV2500), is a double beam spectrophotometer that analyzes different compounds, elements, heavy metals, RNA, and DNA samples.
Atomic Absorption Spectrometry (AAS ZA3300) is used for heavy metal analysis. NASAT Labs has Flame Atomic Absorption Spectrometry (FAAS) that uses acetylene gas to initiate the flame to ionize the sample to be detected by the spectrophotometer.
Inductively coupled plasma - optical emission spectrometry (ICP-EOS Prodigy7) analyzes metals, and various elements simultaneously using argon gas to initiate the plasma.
pH/ion meter (LAQUA H-73) with two channels, one for measurements of pH and another for measurement of ions.
Particle Size Analyzer (PSA- Partica LA-960) is analytical equipment used to measure the particle size distribution of solid or liquid particulate material and can be used for wet or dry analysis ranging from 0.1-5000 microns.
The tour ended by promoting NASAT Lab’s Testing Services and their founded program, the Semiconductor Electronics Bootcamp Program (SEBPro) to equip individuals with the necessary skills and experience to get into the semiconductor industry. There are three courses in SEBPro:
Failure analysis Technician/Engineer
Semiconductor Reliability Technician/Engineer
SEM/EDS Operator
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