Power Device Tester
Sponsored by VT ECE
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LEFT TO RIGHT: Taehyeong Kim, Haoshen Yang, Zhengrui Wang, Keyue Shan
CHALLENGE
CHALLENGE
We developed a power electronics device tester capable of testing the reliability of a device with a double pulse test and an unclamped inductive switching and short circuit withstand capability test.
We developed a power electronics device tester capable of testing the reliability of a device with a double pulse test and an unclamped inductive switching and short circuit withstand capability test.
Customer: Yuhao Zhang, VT ECE SME: Yuhao Zhang, VT ECE
senior design_PowerDeviceTester_closeoutReport.mp4Customer Close Out Meeting
Close Out Report_PowerDeviceTester.pptxPresentation
Poster-ECE-PowerDeviceTester.pptxPoster
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