Reviewer of Journals and Conferences:
- IEEE Transactions on Circuits and Systems I (TCAS-I)
- IEEE Transactions on Circuits and Systems II (TCAS-II)
- IEEE Transactions on VLSI Systems (TVLSI)
- IEEE Transactions on Device and Materials Reliability (TDMR)
- IEEE Transactions on Multi-Scale Computing Systems (TMSCS)
- IEEE Transactions on Design Automation of Electronics Systems (TODAES)
- IET Circuits, Devices and Systems (CDS)
- Journal of Electronic Testing (JETT)
- ACM Journal on Emerging Technologies in Computing Systems (JETC)
- Microelectronics Journal (MEJ)
- Integration, the VLSI Journal
- Microprocessors and Microsystems: Embedded Hardware Design (MICPRO)
- Analog Integrated Circuits and Signal Processing (ALOG)
- International Conference on Biomedical Engineering and Biotechnology (ICBEB)
- IEEE International Symposium on Circuits & Systems (ISCAS)
- IEEE/ACM Great Lakes Symposium on VLSI (GLSVLSI)
- IEEE International New Circuits and Systems Conference (NEWCAS)
- IEEE International Conference on Electronics, Circuits & Systems (ICECS)
- Conference on PhD Research in Microelectronics and Electronics (PRIME)
- IEEE International Midwest Symposium on Circuits and Systems (MWSCAS)