Patents

Research Patents

1. S. Bhattacharjee and J. V. Mathew, "Multielement focused ion beams (MEFIB) from intense, collimated microwave plasmas: concepts to genesis of a novel device", US patent number 9576767 issued on 21 Feb 2017 ( through SIDBI center, IIT Kanpur).

2. S. Bhattacharjee and S. Paul, "Measurement of submicron focused charged particle beams using a current flux grating : spider probe", US patent number 9733366, issued on 15 August 2017 ( through SIDBI center, IIT Kanpur).

3. Sanghamitro Chatterjee, Sudeep Bhattacharjee, Sanjeev K. Maurya, Vyas Srinivasan, Krishnacharya Khare and Sameer Khandekar, "A method for transforming the wettability of a surface", Indian patent number 360984, issued on 12 March 2021 ( through SIDBI center, IIT Kanpur).

4. Kavita Rathore, Prabhat Munshi and Sudeep Bhattacharjee, "An improved emission tomographic measurement system device and a method thereof", Indian patent number 386742, issued on 18 January 2022 (through SIDBI center, IIT Kanpur).

5. Anuj Ram Baitha and Sudeep Bhattacharjee, "A Compact Table Top Dipole Plasma System for Plasma Processing", Indian patent number 538119, issued on 15 May 2024.

6. Sudeep Bhattacharjee, Sushanta Barman, and Sanjeev Kumar Maurya, "Plasma based focused ion beam system for reducing ion beam size using plasma sheath nonlinearity", Indian patent number 548562, issued on 23 August 2024.