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Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices PDF

by : Paul Van Der Heide

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Book Description:

Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS)- Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations- Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission- Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS)- Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions- Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other

Book Detail:

Title: Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

Author : Paul Van Der Heide

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