Scanning Electron Microscope with elemental analysis EDX. Accuracy up to 10nm (Coarse) and 100nm (Fine)

Specifications:

• Scanning electron microscope with easy operation

• Operation knob set for frequently used controls such as magnification and focus

• EDS analyzes elements in the specimen. Also capable of quantitative analysis

• Features a low vacuum mode for non-conductive materials or materials that can't handle high vacuum