Atomic Force Microscope (student version)

Specifications:

• Measurements in air or liquid

• Top and side view windows for sample observation and approach visualization

• Additional measurement modes:

  • Lateral Force Microscopy

  • Fluid Force Microscopy

• Compatible with inverted microscopes

• Ease of cantilever placement due to magnetic snap-on

• x-y scan range: 100 x 100 um

• z-range: 10 um

• z-resolution: 0.152 nm

• Extended AFM sample kit available