This lecture provides an introduction to the general methodology of statistical process control (SPC). It describes an introduction to the Shewhart control charts and the statistical basis of the Shewhart control charts, including choice of sample size, control limits, and sampling interval.

This lecture introduces Shewhart control charts for variables, which are x-bar - R charts and x-bar - s charts. The statistical basis for these control charts are provided, along with how to design them.

This lecture introduces Shewhart control charts for variables, which are p (for the fraction of nonconforming), np (for the number of nonconforming), c and u control charts (for the number of defects or nonconformities). The statistical basis for these control charts are also provided, along with how to design them.

This lecture explains process capability analysis as a formal study to estimate process capability. It provides tools and techniques used in process capability analysis, including histogram, probability plots, control charts, and designed experiments.