To enable large‑scale semiconductor quantum dot arrays, we design and implement on‑chip multiplexing circuits while systematically evaluating device‑to‑device variability, including threshold voltages, valley splitting, and charge noise. By developing circuit architectures that support the simultaneous operation of many elements and establishing statistically informed design guidelines, we deliver the core technologies required for quantum devices at the 100–1,000‑element scale.

We will develop control and measurement techniques for multi-quantum-dot systems operating in ultra-low-temperature environments. This collaborative project aims to advance control technologies for multi-device systems and to acquire understanding into control methods and inhomogeneity in large-scale quantum dot arrays. Ultimately, this work seeks to contribute to the development of core technologies required for the operation of large-scale silicon-based quantum qubit devices.

To advance high‑accuracy quantum current standards using silicon single‑electron pumps, we perform detailed analyses of how device geometry, gate design, and operating frequency affect pumping accuracy. We further pursue designs optimized for parallel operation and high‑speed driving, and introduce machine‑learning‑based optimization to identify robust operating points, accelerating applications in quantum electrical metrology.

We fabricate and characterize novel quantum devices based on diverse materials, including strained silicon, graphene, topological materials, and diamond NV centers. Through the development of 20–40 GHz microwave quantum measurement systems and NV‑center‑based maser amplifiers, we explore quantum device technologies suited for high‑speed and high‑frequency operation.

To efficiently navigate the complex gate‑voltage spaces of multi‑quantum‑dot devices, we develop machine‑learning‑based automated tuning methods. Integrated algorithms perform automatic charge‑stability diagram analysis, quantum dot formation detection, and optimal operating‑point estimation, replacing processes that traditionally required manual intervention. This autonomous control framework is scalable from 10‑element to 100‑element systems, establishing a practical foundation for the operation of large‑scale quantum dot devices.

We construct an automated measurement platform enabling high‑throughput characterization of multi‑quantum‑dot devices. By combining high‑speed data‑acquisition pipelines, state‑classification models, and automated operating‑regime mapping, the system enables comprehensive and efficient device evaluation. Designed for applicability across diverse device architectures and material platforms, this approach supports statistical analysis of large quantum dot arrays and contributes to the establishment of robust, data‑driven design guidelines.