Common Infrastructure
Embedded Files
National Institute for Materials Science (NIMS)
Fume Hood x 2
(For acid/base and organic solvent, Yamato Scientific)
Small Glove Box
(dew point < −80℃, O2 < 1 ppm, UNICO)
(dew point < −80℃, O2 < 1 ppm, UNICO)
Large Glove Box
(dew point < −80℃, O2 < 1 ppm, UNICO)
(dew point < −80℃, O2 < 1 ppm, UNICO)
Acrylic Glove Box
(O2 < 1%, ASONE)
Ultra Pure Water1
(ρ > 18.2 MΩ·cm, TOC < 4 ppb, Yamato Scientific+Merck)
(ρ > 18.2 MΩ·cm, TOC < 4 ppb, Yamato Scientific+Merck)
Ultra Pure Water2
(ρ > 18.2 MΩ·cm, TOC ~ 10ppb, Merck)
(ρ > 18.2 MΩ·cm, TOC ~ 10ppb, Merck)
Powder Synthesis
Gas Burner
(Kinoshita-type blue-hand burner)
(Kinoshita-type blue-hand burner)
Oven
(ASONE)
(ASONE)
Rapid Heating Furnace
(SK Medical Electronics)
(SK Medical Electronics)
HP-gas Furnaces
()
()
GB-connected High Frequency Furnace
(SK Medical Electronics)
(SK Medical Electronics)
GB-connected Tube Furnaces
(For heating under H₂, N₂, Ar flow)
(For heating under H₂, N₂, Ar flow)
Arc Melting Furnace
(TECHNO SEARCH)
(TECHNO SEARCH)
Planetary Ball Mill
(FRITSCH)
(FRITSCH)
Thin Film Fabrication
Thin Film Fabrication
Resistive Heating Evaporatorion System
(Sanyu Electron)
(Sanyu Electron)
Electron Beam Evaporatorion System
(Kenix)
(Kenix)
2 inch Magnetron Co-Sputtering
(3 cathodes, < 10−5Pa)
(3 cathodes, < 10−5Pa)
Physicochemical Characterization
Potentio/Galvanostat
(Biologic)
(Biologic)
UV-vis light sources for Photocatalyst test
(HAYASHI REPIC)
(HAYASHI REPIC)
Sieverts-type Apparatus
(SUZUKI SHOKAN)
(SUZUKI SHOKAN)
Gas Adsorption Analyzer
(MICROTRAC)
(MICROTRAC)
Gas Chromatograph
(BID detector, Shimadzu)
(BID detector, Shimadzu)
GCMS
(Shimadzu)
(Shimadzu)
Ion Chromatograph
(Shimadzu)
(Shimadzu)
Catalyst Characterization Analyzer
(MICROTRAC)
(MICROTRAC)
Structural Analysis
Digital Microscope with Elemental Analyzer
(Keyence)
(Keyence)
FT-IR spectrophotometer
(Shimadzu)
(Shimadzu)
UV–Vis–NIR spectrophotometer
(JASCO)
(JASCO)
Dynamic Secondary Ion Mass Spectrometry
Our laboratory operates a Dynamic Secondary Ion Mass Spectrometer (Dynamic SIMS) capable of high-sensitivity elemental analysis. We specialize in the quantitative evaluation of trace hydrogen and depth profiling within metals and semiconductors by combining hydrogen ion implantation. This system is instrumental in identifying the diffusion coefficients of hydrogen and oxygen in various materials.
Custom-built ion beam apparatus
Low-energy ion beam analysis system
This system is an ultra-high vacuum (UHV) apparatus designed for low-energy elastic recoil detection analysis (ERDA) with combined time-of-flight (TOF) and energy measurements. A pulsed He⁺ ion beam is generated by an electron-impact ion source and directed onto the sample surface at a grazing angle. Recoiled and scattered particles are detected using a microchannel plate (MCP) detector, enabling TOF analysis, while a rotatable electrostatic energy analyzer provides simultaneous kinetic energy information. This combined TOF+energy approach allows precise discrimination of light elements such as hydrogen and deuterium at the outermost atomic layer. The system also integrates a sample manipulator for azimuthal rotation, as well as complementary surface characterization tools such as RHEED. It enables highly sensitive, site-specific analysis of hydrogen in solid surfaces, with detection limits down to the ppm level.
This system is an ultra-high vacuum (UHV) apparatus designed for low-energy elastic recoil detection analysis (ERDA) with combined time-of-flight (TOF) and energy measurements. A pulsed He⁺ ion beam is generated by an electron-impact ion source and directed onto the sample surface at a grazing angle. Recoiled and scattered particles are detected using a microchannel plate (MCP) detector, enabling TOF analysis, while a rotatable electrostatic energy analyzer provides simultaneous kinetic energy information. This combined TOF+energy approach allows precise discrimination of light elements such as hydrogen and deuterium at the outermost atomic layer. The system also integrates a sample manipulator for azimuthal rotation, as well as complementary surface characterization tools such as RHEED. It enables highly sensitive, site-specific analysis of hydrogen in solid surfaces, with detection limits down to the ppm level.
(For more details, check our paper: Combined Energy and TOF Analyses of Low-Energy Elastic Recoil Detection for Analyzing the Topmost Surface of Atomic Deuterium-Irradiated Rutile TiO2 (001) Crystals.)
Others
box furnaces, tube furnaces, chemical storage, scales, ultrasonic cleaner, centrifuge, manual hydraulic press, benchtop cutter, vacuum sealer, various electrical/electrochemical measurement instruments.
Shared Facilities in NIMS
XRD (for powder, film), Raman, TDS, NMR (for liquid and solid), CHNS, XPS, SEM/EDX
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