Book Chapters

Book Chapters (6)

Year 2019 (4)

[6]. Neha Gupta, Jitesh Prasad, Rana Sagar Kumar, Abhinav Vishwakarma and S. K. Vishvakarma, "A Robust Low-Power Write-Assist Data-Dependent-Power-Supplied 12T SRAM Cell", in VLSI Design and Test, 23^rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Springer-Singapore, Eds. Sengupta A., Dasgupta S., Singh V., Sharma R., Kumar Vishvakarma S., vol. 1066. [Book ISBN: 978-981-329-767-8]

[5]. Neha Gupta, Tanisha Gupta, Sajid Khan, Gunjan Rajput and S. K. Vishvakarma, "Low Leakage Highly Stable Robust Ultra-Low Power 8T SRAM Cell" in VLSI Design and Test, 23^rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Springer-Singapore, Eds. Sengupta A., Dasgupta S., Singh V., Sharma R., Kumar Vishvakarma S., vol. 1066. [Book ISBN: 978-981-329-767-8]

[4]. Sajid Khan, Neha Gupta, Abhinav Vishvakarma, Shailesh Singh Chouhan, Jai Gopal Pandey and S. K. Vishvakarma, "Dual-Edge Triggered Light-Weight Implementation of AES for IoT Security", in VLSI Design and Test, 23^rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Springer-Singapore, Eds. Sengupta A., Dasgupta S., Singh V., Sharma R., Kumar Vishvakarma S., vol. 1066. [Book ISBN: 978-981-329-767-8]

[3]. Sajid Khan, Neha Gupta, Gopal Raut, Gunjan Rajput, Jai Gopal Pandey and S. K. Vishvakarma, "An Ultra-Low Power AES Architecture for IoT", in VLSI Design and Test, 23^rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Springer-Singapore, Eds. Sengupta A., Dasgupta S., Singh V., Sharma R., Kumar Vishvakarma S., vol. 1066. [Book ISBN: 978-981-329-767-8]

Year 2018 (2)

[2]. Neha Gupta, Priyanka Parihar, Vaibhav Neema, and Praveen Singh. "Novel Approach for Sleep Transistor Sizing to Suppress Power and Ground Bouncing Noise in MTCMOS Clustering", Lecture Notes in Electrical Engineering book series (LNEE, volume 476), 2018.

[1]. Priyanka Parihar, Neha Gupta, Vaibhav Neema, and Praveen Singh. "6T SRAM Cell Design and Investigation for Ultra-Low-Power Application." Lecture Notes in Electrical Engineering book series (LNEE, volume 511), 2018.