Research

Approach

• Scanning transmission electron microscopy

- Atomic-scale imaging and quantifications

- Electron energy loss spectroscopy (EELS)

- Electron beam induced currents (EBIC)

- Four-dimensional STEM (4D-STEM)

• Ab-initio DFT calculations

• Electron scattering simulations

Mission

• Understanding structure-property relationship at atomic scale in functional oxides

• Developing a new 4D-STEM method to probe point defects and defect complexes in semiconductors