Research

Approach

• Scanning transmission electron microscopy (STEM)

- Atomic-scale imaging and spectroscopies

- Aberration-corrected Lorentz STEM

- Electron beam induced currents (EBIC)

- 4D-scanning precession electron diffractions (4D-SPED)

• In-situ transmission electron microscopy (In-situ TEM)

• Ab-initio DFT calculations

Mission

• Understanding structure–property relationships in functional materials and devices

• Developing new analysis methods based on electron scattering