Research

Approach

• Scanning Transmission Electron Microscopy (STEM)

- Atomic-scale imaging and spectroscopies

- Aberration-corrected Lorentz STEM

- Electron beam induced currents (EBIC)

- 4D-scanning precession electron diffractions (4D-SPED)

• In-situ Transmission Electron Microscopy (In-situ TEM)

• Ab-initio Density Functional Theory (DFT) calculations

Mission

• Understanding structure–property relationships in functional materials and devices

• Developing advanced electron-scattering-based methods for materials characterization