Approach
Scanning transmission electron microscopy
- Atomic-scale imaging and quantifications
- Electron energy loss spectroscopy (EELS)
- Electron beam induced currents (EBIC)
- Four-dimensional STEM (4D-STEM)
Ab-initio DFT calculations
Electron scattering simulations
Mission
Understanding structure-property relationship at atomic scale in functional oxides
Developing new analysis methods based on electron scattering