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Approach
Scanning transmission electron microscopy (STEM)
- Atomic-scale imaging and spectroscopies
- Aberration-corrected Lorentz STEM
- Electron beam induced currents (EBIC)
- 4D-scanning precession electron diffractions (4D-SPED)
Ab-initio DFT calculations
Electron scattering simulations
Mission
Understanding structure-property relationship at atomic scale in functional materials
Developing new analysis methods based on electron scattering
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