Research

Approach

• Scanning transmission electron microscopy

- Atomic-scale imaging and quantifications

- Electron energy loss spectroscopy

- Electron beam induced currents

- Precession-based Lorentz STEM

- Scanning precession electron diffractions 

• Ab-initio DFT calculations

• Electron scattering simulations

Mission

• Understanding structure-property relationship at atomic scale in functional materials

• Developing new analysis methods based on electron scattering

On-going project

• Understanding structure-property relationship at atomic scale in complex oxides

• Developing new analysis methods to probe point defects in semiconductors