X-ray photoelectron spectroscopy (XPS) is a technique enabling analysis of the surface (outermost ~10nm) chemistry of materials including both their elemental composition and chemical states. XPS can be utilized for characterization of a variety of sample types such as battery materials, thin films, polymers, semiconductors, rocks/minerals, and alloys. The EMES operates a Thermo Fisher Nexsa G2 XPS, which is capable of performing XPS analyses as well as complimentary methods including ion scattering spectroscopy (ISS), UV photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy. Use of the Maps software also enables correlative analysis between the Nexsa and the Helios and Axia SEMs operated by the EMES.