N. Bairagi, P. Debnath, and A. Deyasi, "Electro-Optic Performance Estimation of Defect-Driven Double Quantum Well Solar Cell under 1.5 AM Illumination", accepted at 4th IEEE Electron Device Kolkata Conference [EDKCON 2026], 2026 [IEEE Xplore]
A. Saha, S. Bose, S. Roy, P. Debnath, D. Barai, A. Deyasi, "IoT-enabled Multisensor Framework for Smart Monitoring and Fault Localization of Railway Tracks at Turning Points using Cloud-Assisted Data Analytics", accepted at 4th IEEE Electron Device Kolkata Conference [EDKCON 2026], 2026 [IEEE Xplore]
A. Deyasi, P. Debnath, T. Bhowmik, and A. Saha, "Analytical Investigation of Injection Current Driven Polarization Selective Carrier Dynamics for Type-I Double Quantum Well LED Structure", accepted at 4th IEEE Electron Device Kolkata Conference [EDKCON 2026], 2026 [IEEE Xplore]
G. Sarkar, A. Basak, A. Majumdar, and A. Deyasi, "High-Sensitivity PSA Detection with High-K Functional Layer Integrated Nanocavity HEMT Biosensor", accepted at 4th IEEE Electron Device Kolkata Conference [EDKCON 2026], 2026 [IEEE Xplore]
D. Bhattacharyya, S. Chatterjee, N. Bose, P. Debnath, and A. Deyasi, "Smart Embedded Healthcare Framework for Real-Time Ophthalmic Monitoring System using IoT and Cloud-based Analytics", 1st International Conference on VLSI Circuits and Systems [ICVCS 2026], 2026 [IEEE Xplore, DoI: 10.1109/ICVCS69586.2026.11683222]
S. Sen, D. Das, P.Debnath, and A. Deyasi, "Investigating Suitability of Optical Amplifier Design using Type-I Double Quantum Well Structure considering both CB-Light-Hole and CB-Heavy-Hole Transitions", IEEE 9th International Conference on Electronics, Materials Engineering and Nano-Technology [IEMEnTech 2026], 2026 [IEEE Xplore, DoI: 10.1109/IEMENTech202669403.2026.11434392]
S. Das, V. Mukherjee, S. barik, S. Santra, and A. Deyasi, "Hybrid Deep Learning for Melanoma Detection: Integrating U-Net Segmentation, InceptionV3 Feature Extraction, and Random Forest Classification", International Conference on Signal Analysis for Smart Systems [SIGNASS 2026], 2026 [IEEE Xplore, DoI: 10.1109/SIGNASS67826.2026.11479961]