EQUIPMENT

Nanoindenter

(NHT3 | Anton Paar)

UTM (100kN) + Cryogenic Chamber

(RB 301 UNITECH-T | R&B)

UTM (100kN) + Furnace

(RB 301 UNITECH-T | R&B)

UTM (30kN)

ARAMIS 2D System (GOM)

Dual Leadscrew Microtensile  Stage

(5kN / -100°C ~ 525 °C | DEBEN)

(High Temp.) Friction Tester

(NEOPLUS)

Auto Polisher

(MetPrep 3TM | Allied)

High Speed Cutter

(TechCut 5TM | Allied)

Mounting Press

(TechPress 3TM | Allied)

Electrolytic Polisher

(LectroPol-5 | Struers)

Electrolytic Polisher

(Tenupol-5 | Struers)

Furnace

(AWF-12/25 | Lenton)

TEM Prep.

(Struers)

Opitcal Microscope

(Axio Scope. A1 | Carl Zeiss)

Low Mag. Optical Microscope

(AM7915MZTL | Dino-Lite)

Ultrasonic Cleaner

(HWASHIN )

Electronic Analytical Balance

(MCA125S | Sartorius)

Electronic Analytical Balance

(BCE224i | Sartorius)

Electronic Analytical Balance

(BCE653i | Sartorius)

Electronic Analytical Balance

(HS620S  | HANSUNG )

Infrared Thermometers

(CTlaser 3M | OPTRIS)

Hot Plate

Deseccator

Workstation

(XEON 4215R | INTEL)

FE-SEM/EDS

(JSM-7800F)

FE-SEM/EDS

(JSM-7001F)

FE-TEM/STEM-EDS

(TALOS F200X)

HR-XRD

(SmartLab)

AFM

Surface Profiler

Vickers Hardness