Wen-Chiang Hong (Wendell Hong)
Current Research
Device Characteristics and Reliability of ZnO TFT ECE, Rutgers 2011~present
l Process and fabrication of Zn Oxide based TFT
l Device characteristics, reliability study and sensor application of Zn Oxide based TFT
l ZnO thin film transistors based UV photodetector
EDUCATION
Rutgers University New Jersey,USA
PhD Program, Electrical Engineering 2011~present
National Chiao Tung University Hsin-Chu,Taiwan
M.S., Electrical Engineering (GPA 4.00, Ranked 16/170) 2008
B.S., Electrical Engineering (GPA Overall 3.93/ Last 60 4.00, Ranked 10/56) 2006
WORK EXPERIENCE
Rutgers University New Jersey,USA
Department of Electrical and Computer Engineering
Teaching Assistant of Principles of Electrical Engineering I Lab 2011~
Explain basic theorem and demonstrate experiment of building circuits and measurement
Modification of experimental manual.
Grade students' reports.
Teaching Assistant of Principles of Electrical Engineering I 2011~
Lecture on Op Amp and complex power
Solution to homework, quizzes, and exam.
Grade students' homework, quizzes, and exam.
Taiwan Semiconductor Manufacturing Company Limited (TSMC) Hsin-Chu,Taiwan
Process Integration Engineer 2009-2010
Developed advanced 28nm MOSFET process, including adjusting process steps, design rule and process criteria.
Tasks included wafer handling, analysis of devices performance, proposal and execution of improvement plan.
Results: improvement of mismatch (improved 25% in a year), boost of device performance and yield.
Conscription Military Service ---Republic of China Government Taiwan
Training 2008
Boot camp training in Taichung, Taiwan.
Training of using communication instruments and military knowledge in Army Communication & Electronics Information School.
Ranked 1/70.
Second lieutenant of Republic of China Marine Corps 2009
Responsible for over 100 soldiers’ life management and mission execution.
National Chiao Tung University Hsin-Chu,Taiwan
Department of Electrical Engineering
Teaching Assistant of Semiconductor Experiment 2008
Cooperated with National Chiao Tung University Nano Facility Center
Demonstrate how to manipulate processing equipment
Teaching Assistant of Electrical Experiment 2007
Consultant of students’ term projects.
Responsible for grading students’ project, homework, and reports
Teaching Assistant of College Seminar 2006
Responsible for contacting speakers, arranging schedule and venue.
Grading students’ reports.
Former RESEARCH EXPERIENCE
National Chiao Tung University Hsin-Chu,Taiwan
Department of Electronics Engineering
Advisors: Dr. T.Y.Huang and Dr. H.C.Lin
Master thesis 2006-2008
Device Characteristics and Reliability of Metal Induced Laterally Crystallized Poly-Si TFT
Proposed a new method to verify specific damage position resulting from electrical stress with a special test structure.
Developed an electrical method to conveniently analyze crystalline condition of metal-induced lateral crystallization of low temperature poly Silicon as active layer of TFT.
Research Project sponsored by National Science Council 2004-2006
Analysis of density of defect states (DOS) in the Channel of Poly-Si TFT
Measurement, extraction, and analysis of DOS of active layer in TFT.
Revising and maintaining the Matlab programs of extraction of DOS.
PUBLICATION / PRESENTATION / POSTER
C.I. Lin, W.C. Hong, T.F. Lin, H.C. Lin, and T.Y. Huang, “Comparison of the Degradation of MILC and SPC P-Channel Poly-Si TFTs under Static Hot-Carrier Stress Using a Novel Test Structure”, accepted as poster by Electrochemical Society meeting 2011
C.I. Lin, W.C. Hong, T.F. Lin, H.C. Lin, and T.Y. Huang,
”Degradation Mechanisms of MILC P-Channel Poly-Si TFTs under Dynamic Hot-Carrier Stress”, presented at IEDMS 2010
AWARD
Academic Achievement Award National Chiao-Tung University 2007
Ranked 5/170 in academic performance of master study
Scholarship of MO WANG, De-Siang National Chiao-Tung University 2004
Two quotas were chose from 4500 students.
SKILLS
Proficiency in Facilities
Semiconductor processing equipment in clean room:
Lithography: Karl Suss MJB-3 Mask Aligner, I-line stepper and Track
Etcher: Trion Etcher, TCP poly etcher, TEL oxide etcher, Ozone Asher, and Metal etcher
In line Measurement: P-2 Profiler, P-10 surface profiler, n&k, and Stress Measurement System
Film deposition: Trion PECVD, Wet Batch, Horizontal Furnace, Oxford PECVD, ULVAC sputter
Semiconductor parameter analyzer: Agilent 4156, Keithley 4200
Computer Skills: Microsoft Office, C, C++, Matlab