Invited Speakers

• Mario Ancona (Naval Research Laboratory)

Nonlinear thermoelectroelastic simulation of III-N devices

• Asen Asenov (University of Glasgow)

Progress in the simulation of time dependent statistical variability in nano CMOS transistors

• Jean-Pierre Colinge (Taiwan Semiconductor Manufacturing Company)

Nanowire transistors: pushing Moore's law to the limit

• Tibor Grasser (Vienna University of Technology)

Advanced modeling of charge trapping: RTN, 1/f noise, SILC, and BTI

• Kohji Mitsubayashi (Tokyo Medical and Dental University)

Novel biosensing devices for medical applications

• Christian Sandow (Infineon Technologies)

Exploring the limits of the safe operation area of power semiconductor devices

• Mark Stettler (Intel Corporation)

Device and process modeling: 20 years at Intel's other fab