1.   Project Title: Quantitative Surface Analysis by using X-ray Photoelectron Spectroscopy (XPS)

2.   Proposer Name & Address: Dr. Prabir Pal, Principal Investigator

Principal Scientist

Material Characterization Division (MCD)

CSIR-Central Glass and Ceramic Research Institute (CGCRI)

196, Raja S. C. Mullick Road, Kolkata 700 032                                

3. Aims and significant of the projects

Aim

The aim of the proposed consulting proposal is to provide the surface chemical composition and chemical environment of the different species by using XPS analysis in the solid samples provided by the client

List of Objectives:

• • Quantitative analysis of various elements presents in the sample surface (upto 10 nm)

  • Quantification of the chemical compositions or atomic ratio calculations

  • Different functional groups and bonding information in the sample

  • Determination and quantification of different valence states presence in the samples

4. Introduction:

X-ray photoelectron spectroscopy (XPS) is a very powerful experimental tool at the forefront of physics and materials research, which can directly probe the various element presents in the samples. Using this technique, we can estimate qualitatively the chemical composition of any wide range of samples. It gives us quantitative valence state information of the surface of the materials (upto 10 nm). In many industrial and research applications, it is important to understand qualitatively the different functional groups presence in the carbon based sample/products and thin films surface compositions which plays crucial roles in performance like catalysis, thin film coatings, corrosion, adhesion, surface treatments etc.

From the XPS measurements followed by detailed analysis, we provide the elemental details, chemical bonding, valence states quantification and functional groups of the client sample’s.

The background of the principal investigation is X-ray Photoelectron spectroscopy using laboratory and synchrotron based soft x-ray techniques. He has an outstanding record of promoting the XPS data analysis where he has published more than 50 SCI reputed journals with high impact factor (https://scholar.google.com/citations?user=8zT6ajUAAAAJ&hl=en&oi=ao). He is currently holding Principal Scientist position at CSIR-Central Glass and Ceramic Research Institute (CGCRI). He has built several new collaborations around his engagement at CSIR-CGCRI. He has been a key scientist in developing XPS measurements, detailed data analysis and routinely supports outside users from a variety of industries/research institute/universities etc.

5. List of Deliverables:

The following detailed analysis of XPS measurements will be provide to the clients.

• Elemental composition of the surface (top to 10 nm)

• Atomic ratio or empirical formula of samples

• Valence state of each element in the surface

• Uniformity of elemental composition across the surface (mapping)

• Uniformity of elemental composition as a function Ar+ ion etching (depth profiling) (restricted to only high quality thin film samples)

• Different functional group presence in the samples

• Client specific requirements can be obtained from XPS measurements