Lab Facilities

Post date: Apr 21, 2011 5:13:58 AM

1. X-ray Photoelectron spectroscopy (XPS) (Monochromatic Al-Ka line of 1486.7 eV and Dual Magnesium Ka line of 1253.7 eV), UPS (21.2 eV and 40.8 eV), Depth Profiling

MODEL NAME – PHI 5000 VERSAPROBE II, MAKER – PHYSICAL ELECTRONICS

Equipment: Customized PHI 5000 VersaProbe II Scanning X-ray Microprobe system equipped with high flux X-ray source (Aluminum anode with quartz crystal for monochromatic X-ray probe), multi-channel hemi-spherical electron energy analyzer, charge neutralizer and Ar ion sputtering and annealing under UHV. It is designed for rapid, spatially resolved (micron scale) elemental and chemical analysis of surfaces, even in the insulating nature of sample surfaces. UPS can determine the work-function of the materials precisely by using sample biasing while XPS gives true chemical state imaging and multi-point spectroscopy in an automated environment with depth profiling XPS also.

Applications:

Organic, inorganic, and composite advanced materials research

Surface chemistry, corrosion, catalysis, and adhesion

Thin film coatings, Glass and Ceramic Samples Characterization

Tribology surface interactions, material and lubricant transfer characterization

Magnetic storage media and complex multilayer structures

Semiconductor and photovoltaic process, contamination, and failure analysis

Photograph:

Capabilities:

Excellent small area capability (< 10 mm lateral); Secondary Electron Imaging (SXI).

High performance sputter depth profiling, Monochromatic X-ray as well dual X-ray, UPS.

Sample Requirement:  Sample should be in form of solid, bulk, pellet, thin film. The preferable sample size is 8 mm (l) x 5 mm (b) x 2 mm (h) or 8 mm (dia) x 2 mm (h).

2. FESEM with EDAX

3. FIB

4. Solar Simulator and UV-VIS absorption Spectroscopy